放大前向继电器系统的截止率分析

K. Yar, Sumei Sun, P. Ho
{"title":"放大前向继电器系统的截止率分析","authors":"K. Yar, Sumei Sun, P. Ho","doi":"10.1109/VETECF.2010.5594259","DOIUrl":null,"url":null,"abstract":"We derive in this paper the bit error probability and cutoff rate of an Amplify-and-Forward (AF) relay system operating in Rayleigh fast fading. In our model, we consider the relay thermal noise to be non-negligible and derive a closed form expression to approximate the bit error probability. Our approximated closed form expression matches well with simulation result. Using Chernoff bound, we upper bound its pairwise error probability and we also derive the cutoff rate of the AF relay system.","PeriodicalId":417714,"journal":{"name":"2010 IEEE 72nd Vehicular Technology Conference - Fall","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Cutoff Rate Analysis of Amplify-and-Forward Relay System\",\"authors\":\"K. Yar, Sumei Sun, P. Ho\",\"doi\":\"10.1109/VETECF.2010.5594259\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We derive in this paper the bit error probability and cutoff rate of an Amplify-and-Forward (AF) relay system operating in Rayleigh fast fading. In our model, we consider the relay thermal noise to be non-negligible and derive a closed form expression to approximate the bit error probability. Our approximated closed form expression matches well with simulation result. Using Chernoff bound, we upper bound its pairwise error probability and we also derive the cutoff rate of the AF relay system.\",\"PeriodicalId\":417714,\"journal\":{\"name\":\"2010 IEEE 72nd Vehicular Technology Conference - Fall\",\"volume\":\"51 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-10-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE 72nd Vehicular Technology Conference - Fall\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VETECF.2010.5594259\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE 72nd Vehicular Technology Conference - Fall","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VETECF.2010.5594259","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文推导了工作在瑞利快衰落条件下的放大前向(AF)中继系统的误码概率和截止率。在我们的模型中,我们考虑继电器的热噪声是不可忽略的,并推导出一个封闭的形式表达式来近似误码概率。我们的近似封闭表达式与仿真结果吻合较好。利用切尔诺夫界,给出了对偶误差概率的上界,并推导出了AF继电器系统的截止率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Cutoff Rate Analysis of Amplify-and-Forward Relay System
We derive in this paper the bit error probability and cutoff rate of an Amplify-and-Forward (AF) relay system operating in Rayleigh fast fading. In our model, we consider the relay thermal noise to be non-negligible and derive a closed form expression to approximate the bit error probability. Our approximated closed form expression matches well with simulation result. Using Chernoff bound, we upper bound its pairwise error probability and we also derive the cutoff rate of the AF relay system.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信