{"title":"高频波形下纳米填充漆包线的局部放电侵蚀","authors":"S. Ul Haq, S. Jayaram, E. Cherney, L. Simon","doi":"10.1109/ELINSL.2006.1665341","DOIUrl":null,"url":null,"abstract":"The accelerated degradation under high frequency AC voltages of enameled wires that are nano-filled is compared to enameled wires without nano-fillers. The surface roughness and erosion depth of wire specimens, aged in the presence of partial discharge (PD), are studied using a scanning electron microscope (SEM). Changes in the chemical bonding behavior of wire insulation due to PD erosion, are also assessed by Fourier transform infrared spectroscopy (FTIR). A comparative evaluation of the residual life of the wires, aged under high frequency AC waveforms reveals that the newly developed nano-filled enameled wires, especially those with fumed silica, attain a life that is twice that of conventional wires, which is a significant improvement","PeriodicalId":427638,"journal":{"name":"Conference Record of the 2006 IEEE International Symposium on Electrical Insulation","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Partial discharge erosion of nano-filled enameled wires subjected to high frequency waveforms\",\"authors\":\"S. Ul Haq, S. Jayaram, E. Cherney, L. Simon\",\"doi\":\"10.1109/ELINSL.2006.1665341\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The accelerated degradation under high frequency AC voltages of enameled wires that are nano-filled is compared to enameled wires without nano-fillers. The surface roughness and erosion depth of wire specimens, aged in the presence of partial discharge (PD), are studied using a scanning electron microscope (SEM). Changes in the chemical bonding behavior of wire insulation due to PD erosion, are also assessed by Fourier transform infrared spectroscopy (FTIR). A comparative evaluation of the residual life of the wires, aged under high frequency AC waveforms reveals that the newly developed nano-filled enameled wires, especially those with fumed silica, attain a life that is twice that of conventional wires, which is a significant improvement\",\"PeriodicalId\":427638,\"journal\":{\"name\":\"Conference Record of the 2006 IEEE International Symposium on Electrical Insulation\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Record of the 2006 IEEE International Symposium on Electrical Insulation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ELINSL.2006.1665341\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the 2006 IEEE International Symposium on Electrical Insulation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELINSL.2006.1665341","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Partial discharge erosion of nano-filled enameled wires subjected to high frequency waveforms
The accelerated degradation under high frequency AC voltages of enameled wires that are nano-filled is compared to enameled wires without nano-fillers. The surface roughness and erosion depth of wire specimens, aged in the presence of partial discharge (PD), are studied using a scanning electron microscope (SEM). Changes in the chemical bonding behavior of wire insulation due to PD erosion, are also assessed by Fourier transform infrared spectroscopy (FTIR). A comparative evaluation of the residual life of the wires, aged under high frequency AC waveforms reveals that the newly developed nano-filled enameled wires, especially those with fumed silica, attain a life that is twice that of conventional wires, which is a significant improvement
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
