基于圆盘流体动力抛光的半导体晶圆表面超精密抛光工艺研究

JI Xiang-min, Jiang Xiaoxiong, Lin Bin, Cao Zhang-Chen
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引用次数: 0

摘要

目前,超光滑表面的制备在集成电路制造中起着至关重要的作用,特别是在硅、二氧化硅和碳化硅晶圆等半导体衬底材料中。为了高效生产超光滑半导体晶圆表面,提出了一种新型的圆盘流体动力抛光(DHDP)工艺。在DHDP工艺中,抛光液从抛光工具中心注入,并在抛光垫上设计螺旋压力槽。然后,在圆盘抛光工具的高转速和施加的载荷下,圆盘抛光垫与晶圆表面之间形成流体膜。在流体膜中,颗粒在动水压力和剪切应力的作用下冲击晶圆工件。磨料颗粒在流体膜内的动水压力作用下腐蚀工件。然后,通过一系列实验,研究了刀具速度和加工时间对表面质量的影响。提高抛光工具的转速可以提高表面质量。石英玻璃晶片表面粗糙度(Ra)可达0.7nm,峰值(PV)为8.9nm。此外,DHDP工艺可以有效地降低表面粗糙度,获得半导体晶圆的超光滑表面。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Research on Ultra-Precision Polishing Process of Semiconductor Wafer Surface Based on Disc Hydrodynamic Polishing
Nowadays, the fabrication of ultra-smooth surface play critical roles in, integrated circuits (IC) manufacturing, especially for semiconductor substrate materials of silicon, silicon dioxide and silicon carbide wafer. To efficiently production ultra-smooth semiconductor wafer surface, a novel Disc Hydrodynamic Polishing (DHDP) process is proposed. In DHDP process, the polishing slurry was injected from the center of polishing tool and a screw pressure groove was designed on the polishing pad. Then, the fluid film will be formed between the disc polishing pad and the wafer surface, under the high rotation speed and applied load of disc polishing tool. In the fluid film, the particles were droved by the hydrodynamic pressure and shear stress impact the wafer workpiece. The abrasive particles erode the workpiece under the hydrodynamic pressure in the fluid film. Then, the effect of tool speed and machining time on the quality of surface is studied, through a series of experiments. The rotational speed of polishing tool can improve the surface quality. The surface of fused quartz glass wafer surface roughness(Ra) could reach 0.7nm and the peak value(PV) is 8.9nm, which was polished by DHDP process. Moreover, DHDP process can efficiently reduce the surface roughness and acquire ultra-smooth surface for semiconductor wafer.
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