{"title":"暂态故障注入对容错微机系统VHDL模型的影响研究","authors":"D. Gil, J. Gracia, J. Baraza, P. Gil","doi":"10.1109/OLT.2000.856615","DOIUrl":null,"url":null,"abstract":"This work presents a campaign of fault injection to validate the dependability of a fault tolerant microcomputer system. The system is duplex with cold stand-by sparing, parity detection and a watchdog timer. The faults have been injected on a chip-level VHDL model, using an injection tool designed for this purpose. We have carried out a set of injection experiments (with 3000 injections each), injecting transient faults of types stuck-at, bit-flip, indetermination and delay on both the signals and variables of the system, running two different workloads. We have analysed the pathology of the propagated errors, measured their latency, and calculated both detection and recovery coverage. For instance, system detection coverages (including non-effective errors) up to 98%, and system recovery coverage up to 94% have been obtained for short transient faults.","PeriodicalId":334770,"journal":{"name":"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"27","resultStr":"{\"title\":\"A study of the effects of transient fault injection into the VHDL model of a fault-tolerant microcomputer system\",\"authors\":\"D. Gil, J. Gracia, J. Baraza, P. Gil\",\"doi\":\"10.1109/OLT.2000.856615\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents a campaign of fault injection to validate the dependability of a fault tolerant microcomputer system. The system is duplex with cold stand-by sparing, parity detection and a watchdog timer. The faults have been injected on a chip-level VHDL model, using an injection tool designed for this purpose. We have carried out a set of injection experiments (with 3000 injections each), injecting transient faults of types stuck-at, bit-flip, indetermination and delay on both the signals and variables of the system, running two different workloads. We have analysed the pathology of the propagated errors, measured their latency, and calculated both detection and recovery coverage. For instance, system detection coverages (including non-effective errors) up to 98%, and system recovery coverage up to 94% have been obtained for short transient faults.\",\"PeriodicalId\":334770,\"journal\":{\"name\":\"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"27\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/OLT.2000.856615\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OLT.2000.856615","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A study of the effects of transient fault injection into the VHDL model of a fault-tolerant microcomputer system
This work presents a campaign of fault injection to validate the dependability of a fault tolerant microcomputer system. The system is duplex with cold stand-by sparing, parity detection and a watchdog timer. The faults have been injected on a chip-level VHDL model, using an injection tool designed for this purpose. We have carried out a set of injection experiments (with 3000 injections each), injecting transient faults of types stuck-at, bit-flip, indetermination and delay on both the signals and variables of the system, running two different workloads. We have analysed the pathology of the propagated errors, measured their latency, and calculated both detection and recovery coverage. For instance, system detection coverages (including non-effective errors) up to 98%, and system recovery coverage up to 94% have been obtained for short transient faults.