移动掩模深x射线光刻中最佳掩模运动模式分析算法

N. Matsuzuka, O. Tabata
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引用次数: 3

摘要

移动掩模深x射线光刻技术已经证明了其在制造微喷嘴、微透镜阵列等三维微结构方面的可行性。在该技术中,掩膜运动模式的确定对于实现所需的目标微结构至关重要。为了从理论上确定最优的运动模式,提出了一种利用傅里叶变换技术的“逆方法”算法。作为完成逆方法的第一步,开发了限于垂直和横向两个空间维度的算法。将该算法直接应用于v形槽的加工中,并没有得到令人满意的结果。我们报告了该算法的采用版本,最终允许成功制造v形凹槽。此外,该算法可用于确定最优掩码。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Algorithm for analyzing optimal mask movement pattern in moving mask deep X-ray lithography
Moving mask deep X-ray lithography has demonstrated its feasibility for fabricating some 3-dimensional (3D) microstructures such as micro-nozzles and micro-lens arrays and so on. In this technique, the determination of mask movement patterns is crucial for realizing the desired target microstructures. For theoretical determination of optimal movement patterns, an algorithm exploiting the Fourier transformation technique called "Inverse Approach" was proposed. As a first step towards the completion of the Inverse Approach, the algorithm limited to the 2 space dimensions, vertical and lateral, was developed. Straightforward application of this algorithm to the fabrication of V-shaped grooves did not yield satisfying results. We reported an adopted version of this algorithm which ultimately allowed successful fabrication of the V-shaped grooves. Furthermore, this algorithm could be applied to the determination of an optimal mask.
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