{"title":"Cyclogen:自动功能级测试发生器","authors":"B. Ayari, B. Kaminska","doi":"10.1109/ATS.1992.224449","DOIUrl":null,"url":null,"abstract":"The authors have laid the foundations for a functional test generation procedure based on a cyclomatic complexity measure (CCM) and on the reduced, ordered binary decision diagram representation (ROBDD) for Boolean function manipulation. The CCM has been defined for one-output and multi-output electronic circuits predicting a minimal number of test vectors. This new test generation approach, called Cyclogen, has been implemented, and the tests for several functional primitives as well as for the ISCAS-85 benchmark circuits have been generated successfully. The results show that this approach is effective and promising.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Cyclogen: automatic, functional-level test generator\",\"authors\":\"B. Ayari, B. Kaminska\",\"doi\":\"10.1109/ATS.1992.224449\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors have laid the foundations for a functional test generation procedure based on a cyclomatic complexity measure (CCM) and on the reduced, ordered binary decision diagram representation (ROBDD) for Boolean function manipulation. The CCM has been defined for one-output and multi-output electronic circuits predicting a minimal number of test vectors. This new test generation approach, called Cyclogen, has been implemented, and the tests for several functional primitives as well as for the ISCAS-85 benchmark circuits have been generated successfully. The results show that this approach is effective and promising.<<ETX>>\",\"PeriodicalId\":208029,\"journal\":{\"name\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1992.224449\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224449","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Cyclogen: automatic, functional-level test generator
The authors have laid the foundations for a functional test generation procedure based on a cyclomatic complexity measure (CCM) and on the reduced, ordered binary decision diagram representation (ROBDD) for Boolean function manipulation. The CCM has been defined for one-output and multi-output electronic circuits predicting a minimal number of test vectors. This new test generation approach, called Cyclogen, has been implemented, and the tests for several functional primitives as well as for the ISCAS-85 benchmark circuits have been generated successfully. The results show that this approach is effective and promising.<>
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