{"title":"利用数字图像/散斑相关对BGA封装进行热力学诊断","authors":"P. Zhou, K. Goodson","doi":"10.1109/ITHERM.2000.866197","DOIUrl":null,"url":null,"abstract":"Thermomechanical diagnostic techniques are required for the characterization and reliability engineering of electronic packaging. Digital image/speckle correlation (DISC) is attractive for large throughput testing because it eliminates the specimen grating required by moire interferometry and does not require coherent illumination. Problems of DISC include a larger sensitivity to noise and a reduction of sensitivity for large fields of view. The present work uses DISC to study thermomechanical deformations of solder-joints in a cross-sectioned ball grid array (BGA) thermal test package. An iterative algorithm is developed to calculate the in-plane deformation and strain. Frame averaging of digital images reduces the noise, while a scanning stage allows a large effective field of view with acceptable sensitivity. This work achieves a spatial resolution of 2 /spl mu/m and a sensitivity of 0.01 pixels. Average strains in these solder joints are also calculated to provide data for fatigue lifetime estimation. The approach demonstrated here is promising for on-line thermomechanical diagnostics in IC manufacturing.","PeriodicalId":201262,"journal":{"name":"ITHERM 2000. The Seventh Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.00CH37069)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Thermomechanical diagnostics of BGA packages using digital image/speckle correlation\",\"authors\":\"P. Zhou, K. Goodson\",\"doi\":\"10.1109/ITHERM.2000.866197\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Thermomechanical diagnostic techniques are required for the characterization and reliability engineering of electronic packaging. Digital image/speckle correlation (DISC) is attractive for large throughput testing because it eliminates the specimen grating required by moire interferometry and does not require coherent illumination. Problems of DISC include a larger sensitivity to noise and a reduction of sensitivity for large fields of view. The present work uses DISC to study thermomechanical deformations of solder-joints in a cross-sectioned ball grid array (BGA) thermal test package. An iterative algorithm is developed to calculate the in-plane deformation and strain. Frame averaging of digital images reduces the noise, while a scanning stage allows a large effective field of view with acceptable sensitivity. This work achieves a spatial resolution of 2 /spl mu/m and a sensitivity of 0.01 pixels. Average strains in these solder joints are also calculated to provide data for fatigue lifetime estimation. The approach demonstrated here is promising for on-line thermomechanical diagnostics in IC manufacturing.\",\"PeriodicalId\":201262,\"journal\":{\"name\":\"ITHERM 2000. The Seventh Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.00CH37069)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ITHERM 2000. The Seventh Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.00CH37069)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ITHERM.2000.866197\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ITHERM 2000. The Seventh Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.00CH37069)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITHERM.2000.866197","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Thermomechanical diagnostics of BGA packages using digital image/speckle correlation
Thermomechanical diagnostic techniques are required for the characterization and reliability engineering of electronic packaging. Digital image/speckle correlation (DISC) is attractive for large throughput testing because it eliminates the specimen grating required by moire interferometry and does not require coherent illumination. Problems of DISC include a larger sensitivity to noise and a reduction of sensitivity for large fields of view. The present work uses DISC to study thermomechanical deformations of solder-joints in a cross-sectioned ball grid array (BGA) thermal test package. An iterative algorithm is developed to calculate the in-plane deformation and strain. Frame averaging of digital images reduces the noise, while a scanning stage allows a large effective field of view with acceptable sensitivity. This work achieves a spatial resolution of 2 /spl mu/m and a sensitivity of 0.01 pixels. Average strains in these solder joints are also calculated to provide data for fatigue lifetime estimation. The approach demonstrated here is promising for on-line thermomechanical diagnostics in IC manufacturing.