基于LOG112和C8051F006 soc的四点探头法进行电阻率测量

International Conference on Instrumentation, Communication, Information Technology, and Biomedical Engineering 2009 Pub Date : 2009-11-01 DOI:10.1109/ICICI-BME.2009.5417218

Riska Ekawita, Endah Rahmawati, M. Abdullah

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引用次数: 2

摘要

研制了一种采用LOG112和C8051F006芯片的四点探头电阻率计。对电阻率计进行了校准和检查。电阻器的电流-电压特性电阻与电阻器上标注的电阻一致。电阻器的电阻率与注入电流无关，这与理论一致。TiO2薄膜的电阻率取决于注入少量载流子和/或多数载流子的电流。

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Four point probe method based on LOG112 and C8051F006 SoCs for resistivity measurement

A four point probe-based resistivity meter using LOG112 and C8051F006 SoCs has been developed. The resistivity meter was calibrated and examined. Current-voltage characteristic-based resistances of resistors are consistent with those labeled to the resistors. Resistivities of the resistors are independent of the injected current, which agree with theory. The resistivity of TiO2 thin film depends on the injected current due to minority and/or majority carrier injection.

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International Conference on Instrumentation, Communication, Information Technology, and Biomedical Engineering 2009

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