{"title":"一种软件故障定位框架:变应力反应","authors":"Pengpeng Nie, Ji Geng, Zhiguang Qin","doi":"10.1109/ICCCAS.2010.5582003","DOIUrl":null,"url":null,"abstract":"Since automated fault localization can improve the efficiency of both the testing and debugging process, it comes to an indispensable part of high security and reliable software development for the computer networks. A novel software fault localization framework: Variable Stress Reaction (VSR) is proposed in this paper, which works well for data type overflow detection. The experimental results show that our approach has the potential to be effective in localizing the faults for software.","PeriodicalId":199950,"journal":{"name":"2010 International Conference on Communications, Circuits and Systems (ICCCAS)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A framework on software fault localization: Variable Stress Reaction\",\"authors\":\"Pengpeng Nie, Ji Geng, Zhiguang Qin\",\"doi\":\"10.1109/ICCCAS.2010.5582003\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Since automated fault localization can improve the efficiency of both the testing and debugging process, it comes to an indispensable part of high security and reliable software development for the computer networks. A novel software fault localization framework: Variable Stress Reaction (VSR) is proposed in this paper, which works well for data type overflow detection. The experimental results show that our approach has the potential to be effective in localizing the faults for software.\",\"PeriodicalId\":199950,\"journal\":{\"name\":\"2010 International Conference on Communications, Circuits and Systems (ICCCAS)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-07-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 International Conference on Communications, Circuits and Systems (ICCCAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCCAS.2010.5582003\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Conference on Communications, Circuits and Systems (ICCCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCCAS.2010.5582003","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A framework on software fault localization: Variable Stress Reaction
Since automated fault localization can improve the efficiency of both the testing and debugging process, it comes to an indispensable part of high security and reliable software development for the computer networks. A novel software fault localization framework: Variable Stress Reaction (VSR) is proposed in this paper, which works well for data type overflow detection. The experimental results show that our approach has the potential to be effective in localizing the faults for software.
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