{"title":"电子废弃物危害标准认定的元分析","authors":"J. Lincoln, O. Ogunseitan, A. Shapiro","doi":"10.1109/ISEE.2006.1650040","DOIUrl":null,"url":null,"abstract":"A variety of leaching test protocols are used domestically and internationally to assess the environmental hazard potential of solid wastes. We surveyed and compared leaching test procedures and their application to electronic waste. We describe the limitations of these protocols and define circumstances under which they may contribute to the classification of electronic waste. We find that the diversity of testing procedures under various regulatory guidelines at the domestic and international levels create an impediment to environmentally-benign product design and the effective management of hazardous electronic waste","PeriodicalId":141255,"journal":{"name":"Proceedings of the 2006 IEEE International Symposium on Electronics and the Environment, 2006.","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Meta-analysis of Hazard Criteria Designation for Electronic Waste\",\"authors\":\"J. Lincoln, O. Ogunseitan, A. Shapiro\",\"doi\":\"10.1109/ISEE.2006.1650040\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A variety of leaching test protocols are used domestically and internationally to assess the environmental hazard potential of solid wastes. We surveyed and compared leaching test procedures and their application to electronic waste. We describe the limitations of these protocols and define circumstances under which they may contribute to the classification of electronic waste. We find that the diversity of testing procedures under various regulatory guidelines at the domestic and international levels create an impediment to environmentally-benign product design and the effective management of hazardous electronic waste\",\"PeriodicalId\":141255,\"journal\":{\"name\":\"Proceedings of the 2006 IEEE International Symposium on Electronics and the Environment, 2006.\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-05-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2006 IEEE International Symposium on Electronics and the Environment, 2006.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEE.2006.1650040\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2006 IEEE International Symposium on Electronics and the Environment, 2006.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEE.2006.1650040","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Meta-analysis of Hazard Criteria Designation for Electronic Waste
A variety of leaching test protocols are used domestically and internationally to assess the environmental hazard potential of solid wastes. We surveyed and compared leaching test procedures and their application to electronic waste. We describe the limitations of these protocols and define circumstances under which they may contribute to the classification of electronic waste. We find that the diversity of testing procedures under various regulatory guidelines at the domestic and international levels create an impediment to environmentally-benign product design and the effective management of hazardous electronic waste