Wang Yuanchun, Man Weidong, Lv Changzhi, L. Zhiguo, Guo Chunsheng, Li Fei
{"title":"DC/DC模块热分析","authors":"Wang Yuanchun, Man Weidong, Lv Changzhi, L. Zhiguo, Guo Chunsheng, Li Fei","doi":"10.1109/IPFA.2009.5232619","DOIUrl":null,"url":null,"abstract":"Ever-increasing DC/DC power density and peak temperature challenge its reliability and performance. Thermal simulation and analysis play a significant role in development of new generation of DC/DC package design. This paper presents an accurate and fast approach to simulate the thermal distribution of a DC/DC module. The thermal distribution is simulated with ANSYS, and verified by infrared thermal images. This made feasible the thermal design to reduce stressing temperature peaks, so improving DC/DC reliability significantly.","PeriodicalId":210619,"journal":{"name":"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Thermal analysis of DC/DC module\",\"authors\":\"Wang Yuanchun, Man Weidong, Lv Changzhi, L. Zhiguo, Guo Chunsheng, Li Fei\",\"doi\":\"10.1109/IPFA.2009.5232619\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Ever-increasing DC/DC power density and peak temperature challenge its reliability and performance. Thermal simulation and analysis play a significant role in development of new generation of DC/DC package design. This paper presents an accurate and fast approach to simulate the thermal distribution of a DC/DC module. The thermal distribution is simulated with ANSYS, and verified by infrared thermal images. This made feasible the thermal design to reduce stressing temperature peaks, so improving DC/DC reliability significantly.\",\"PeriodicalId\":210619,\"journal\":{\"name\":\"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-07-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2009.5232619\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2009.5232619","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Ever-increasing DC/DC power density and peak temperature challenge its reliability and performance. Thermal simulation and analysis play a significant role in development of new generation of DC/DC package design. This paper presents an accurate and fast approach to simulate the thermal distribution of a DC/DC module. The thermal distribution is simulated with ANSYS, and verified by infrared thermal images. This made feasible the thermal design to reduce stressing temperature peaks, so improving DC/DC reliability significantly.