{"title":"功率不足的NAND闪存:利润和风险","authors":"Hung-Wei Tseng, Laura M. Grupp, S. Swanson","doi":"10.1145/2463209.2488935","DOIUrl":null,"url":null,"abstract":"MLC Flash memory is getting more popular in computer systems ranging from sensor networks and embedded systems to large-scale server systems. However, MLC flash has many reliability concerns, including the potential for corruption due to supply voltage fluctuations. This paper characterizes MLC flash when the chip is underpowered (i.e., power fading and voltage droops). We demonstrate that underpowering flash can cause serious errors, but also help saving up to 45% of operation energy without incurring failure.","PeriodicalId":320207,"journal":{"name":"2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"Underpowering NAND flash: Profits and perils\",\"authors\":\"Hung-Wei Tseng, Laura M. Grupp, S. Swanson\",\"doi\":\"10.1145/2463209.2488935\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"MLC Flash memory is getting more popular in computer systems ranging from sensor networks and embedded systems to large-scale server systems. However, MLC flash has many reliability concerns, including the potential for corruption due to supply voltage fluctuations. This paper characterizes MLC flash when the chip is underpowered (i.e., power fading and voltage droops). We demonstrate that underpowering flash can cause serious errors, but also help saving up to 45% of operation energy without incurring failure.\",\"PeriodicalId\":320207,\"journal\":{\"name\":\"2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-05-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2463209.2488935\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2463209.2488935","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
MLC Flash memory is getting more popular in computer systems ranging from sensor networks and embedded systems to large-scale server systems. However, MLC flash has many reliability concerns, including the potential for corruption due to supply voltage fluctuations. This paper characterizes MLC flash when the chip is underpowered (i.e., power fading and voltage droops). We demonstrate that underpowering flash can cause serious errors, but also help saving up to 45% of operation energy without incurring failure.
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