带有专用进位链的混合粒度可重构体系结构的布局算法

Takashi Imagawa, Koki Honda, H. Ochi
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引用次数: 3

摘要

针对具有专用进位链的混合粒度可重构结构(MGRA),提出了一种基于解析式布局(AP)和低温模拟退火(SA)的布局算法。假设目标MGRAs具有具有专用进位链的细粒度块,用于实现高速加/减法,而粗粒度块用于实现复杂的算术运算。虽然这种混合粒度的体系结构有望提高实现的应用程序电路的性能,但由于固有的放置限制,放置会成为问题。例如,一些逻辑块与其他逻辑块之间有许多连接,诸如此类的约束会导致简单的基于对交换的SA收敛到局部最优。提出的算法使用AP来确定SA的初始位置。AP探讨了粗粒度块和由细粒度块和专用进位链组成的加/减法的适当位置。另一方面,SA主要用于确定剩余细粒度块的最佳位置。评估结果表明,该算法比多址多径(VPR)算法平均降低了18.4%、6.0%和67.6%的放置成本、关键路径延迟和运行时间。基准测试包括仅由细粒度逻辑组成的电路。因此,所提出的算法有望改善广泛应用电路的放置质量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Placement algorithm for mixed-grained reconfigurable architecture with dedicated carry chain
This paper proposes a placement algorithm using analytical placement (AP) and low-temperature simulated annealing (SA) for mixed-grained reconfigurable architecture (MGRA) with dedicated carry chains. The target MGRAs are assumed to have fine-grained blocks with dedicated carry chains to implement high-speed adders/subtracters and coarse-grained blocks to implement complicated arithmetic operations. Although this mixed-grained architecture is expected to enhance the performance of the implemented application circuit, placement becomes problematic because of the inherent placement constraints. For example, some logic blocks have many connections to others and constraints such as these cause simple pair-swap-based SA to converge to a local optimum. The proposed algorithm uses AP to determine an initial placement for SA. The AP explores an appropriate placement of coarse-grained blocks and adders/subtracters consisting of fine-grained blocks and dedicated carry chains. On the other hand, SA is mainly used to determine optimal placement of the remaining fine-grained blocks. The evaluations show that the proposed algorithm reduces the placement cost, critical path delay, and runtime by 18.4%, 6.0%, and 67.6% on average, respectively, over the versatile place and route (VPR) approach. The benchmark includes circuits consisting of only fine-grained logic. Hence, the proposed algorithm is expected to improve the placement quality for a wide range of application circuits.
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