{"title":"密集集成的高性能cmos测试仪","authors":"Gary J. Lesmeister","doi":"10.1109/TEST.1991.519703","DOIUrl":null,"url":null,"abstract":"+zero Time Mux - tap path CMOS, when applied with a closed-loop, fast path design methodology, is a viable choice as the core technology for a densely integrated high performance integrated circuit tester.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A DENSELY INTEGRATED HIGH PERFORMANCE CMOS TESTER\",\"authors\":\"Gary J. Lesmeister\",\"doi\":\"10.1109/TEST.1991.519703\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"+zero Time Mux - tap path CMOS, when applied with a closed-loop, fast path design methodology, is a viable choice as the core technology for a densely integrated high performance integrated circuit tester.\",\"PeriodicalId\":272630,\"journal\":{\"name\":\"1991, Proceedings. International Test Conference\",\"volume\":\"51 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991, Proceedings. International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1991.519703\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519703","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
+zero Time Mux - tap path CMOS, when applied with a closed-loop, fast path design methodology, is a viable choice as the core technology for a densely integrated high performance integrated circuit tester.
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