{"title":"基于有限元法的电容层析成像系统测量结果与仿真比较","authors":"G. Holler, A. Fuchs, B. Schweighofer, G. Brasseur","doi":"10.1109/SFICON.2004.1287141","DOIUrl":null,"url":null,"abstract":"Electrical capacitance tomography (ECT) systems require multiple inter-electrode capacitance measurements or multiple electrode potential measurements as input for their reconstruction algorithms. The paper describes the electronic circuitry developed to provide the required data for the Gauss-Newton type reconstruction algorithm used at the Institute, as well as the models for simulating the sensor geometry and the electronic circuitry. The short-and long-term stability of the circuitry is analyzed. Furthermore, the electrode voltages predicted by simulations are compared to the measured potentials.","PeriodicalId":381233,"journal":{"name":"ISA/IEEE Sensors for Industry Conference, 2004. Proceedings the","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Comparison of measurement results and simulations based on finite element method for an electrical capacitance tomography system\",\"authors\":\"G. Holler, A. Fuchs, B. Schweighofer, G. Brasseur\",\"doi\":\"10.1109/SFICON.2004.1287141\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electrical capacitance tomography (ECT) systems require multiple inter-electrode capacitance measurements or multiple electrode potential measurements as input for their reconstruction algorithms. The paper describes the electronic circuitry developed to provide the required data for the Gauss-Newton type reconstruction algorithm used at the Institute, as well as the models for simulating the sensor geometry and the electronic circuitry. The short-and long-term stability of the circuitry is analyzed. Furthermore, the electrode voltages predicted by simulations are compared to the measured potentials.\",\"PeriodicalId\":381233,\"journal\":{\"name\":\"ISA/IEEE Sensors for Industry Conference, 2004. Proceedings the\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-08-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ISA/IEEE Sensors for Industry Conference, 2004. Proceedings the\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SFICON.2004.1287141\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISA/IEEE Sensors for Industry Conference, 2004. Proceedings the","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SFICON.2004.1287141","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Comparison of measurement results and simulations based on finite element method for an electrical capacitance tomography system
Electrical capacitance tomography (ECT) systems require multiple inter-electrode capacitance measurements or multiple electrode potential measurements as input for their reconstruction algorithms. The paper describes the electronic circuitry developed to provide the required data for the Gauss-Newton type reconstruction algorithm used at the Institute, as well as the models for simulating the sensor geometry and the electronic circuitry. The short-and long-term stability of the circuitry is analyzed. Furthermore, the electrode voltages predicted by simulations are compared to the measured potentials.