{"title":"减少动态损耗的开关电容器电压乘法器中的电荷复用","authors":"Younis Allasasmeh, S. Gregori","doi":"10.1109/MWSCAS.2010.5548869","DOIUrl":null,"url":null,"abstract":"In this work we study the application of charge reusing to switched-capacitor voltage multipliers. Considering three popular circuits (i.e. the Dickson, the heap, and the Fibonacci charge pumps), we analyze the dynamic power losses due to parasitic capacitances. We show how a charge reuse technique effectively decreases the dynamic power losses. The validity of our analysis is verified through simulations of design examples, which also illustrate the impact of charge reusing on voltage gain, output resistance, and conversion efficiency.","PeriodicalId":245322,"journal":{"name":"2010 53rd IEEE International Midwest Symposium on Circuits and Systems","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"27","resultStr":"{\"title\":\"Charge reusing in switched-capacitor voltage multipliers with reduced dynamic losses\",\"authors\":\"Younis Allasasmeh, S. Gregori\",\"doi\":\"10.1109/MWSCAS.2010.5548869\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work we study the application of charge reusing to switched-capacitor voltage multipliers. Considering three popular circuits (i.e. the Dickson, the heap, and the Fibonacci charge pumps), we analyze the dynamic power losses due to parasitic capacitances. We show how a charge reuse technique effectively decreases the dynamic power losses. The validity of our analysis is verified through simulations of design examples, which also illustrate the impact of charge reusing on voltage gain, output resistance, and conversion efficiency.\",\"PeriodicalId\":245322,\"journal\":{\"name\":\"2010 53rd IEEE International Midwest Symposium on Circuits and Systems\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-08-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"27\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 53rd IEEE International Midwest Symposium on Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSCAS.2010.5548869\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 53rd IEEE International Midwest Symposium on Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.2010.5548869","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Charge reusing in switched-capacitor voltage multipliers with reduced dynamic losses
In this work we study the application of charge reusing to switched-capacitor voltage multipliers. Considering three popular circuits (i.e. the Dickson, the heap, and the Fibonacci charge pumps), we analyze the dynamic power losses due to parasitic capacitances. We show how a charge reuse technique effectively decreases the dynamic power losses. The validity of our analysis is verified through simulations of design examples, which also illustrate the impact of charge reusing on voltage gain, output resistance, and conversion efficiency.
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