PSS-PVA/n-Si异质结二极管电子参数的提取

D. Khan, M. H. Sayyad
{"title":"PSS-PVA/n-Si异质结二极管电子参数的提取","authors":"D. Khan, M. H. Sayyad","doi":"10.1109/ICCRD.2010.114","DOIUrl":null,"url":null,"abstract":"Using spin coating, a PEDOT:PSS-PVA/n-Si device has been fabricated by depositing the composite of conducting polymer PEDOT:PSS and poly(vinyl alcohol) on n-Si substrate. The current-voltage measurements of the device have been evaluated at room temperature in dark. The PEDOT:PSSPVA/ n-Si structure demonstrated the rectifying behavior. The various electronic parameters such as rectification ratio, turn on voltage, ideality factor, reverse saturation current, barrier height, series and shunt resistances were extracted from the IV characteristics of this diode. The values of ideality factor and series resistance were also verified by using Cheung functions. In addition, the conduction mechanism in the device was also investigated by I-V curves.","PeriodicalId":158568,"journal":{"name":"2010 Second International Conference on Computer Research and Development","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Extraction of Electronic Parameters of PEDOT:PSS-PVA/n-Si Heterojunction Diode\",\"authors\":\"D. Khan, M. H. Sayyad\",\"doi\":\"10.1109/ICCRD.2010.114\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Using spin coating, a PEDOT:PSS-PVA/n-Si device has been fabricated by depositing the composite of conducting polymer PEDOT:PSS and poly(vinyl alcohol) on n-Si substrate. The current-voltage measurements of the device have been evaluated at room temperature in dark. The PEDOT:PSSPVA/ n-Si structure demonstrated the rectifying behavior. The various electronic parameters such as rectification ratio, turn on voltage, ideality factor, reverse saturation current, barrier height, series and shunt resistances were extracted from the IV characteristics of this diode. The values of ideality factor and series resistance were also verified by using Cheung functions. In addition, the conduction mechanism in the device was also investigated by I-V curves.\",\"PeriodicalId\":158568,\"journal\":{\"name\":\"2010 Second International Conference on Computer Research and Development\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-05-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 Second International Conference on Computer Research and Development\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCRD.2010.114\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Second International Conference on Computer Research and Development","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCRD.2010.114","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

采用自旋镀膜技术,在n-Si衬底上沉积导电聚合物PEDOT:PSS和聚乙烯醇的复合材料,制备了PEDOT:PSS- pva /n-Si器件。该装置的电流-电压测量值已在室温、黑暗条件下进行了评估。PEDOT:PSSPVA/ n-Si结构表现出整流行为。从该二极管的IV特性中提取了整流比、导通电压、理想因数、反向饱和电流、阻挡高度、串联电阻和并联电阻等各种电子参数。利用张氏函数对理想因数和串联电阻的取值进行了验证。此外,还利用I-V曲线对器件的传导机理进行了研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Extraction of Electronic Parameters of PEDOT:PSS-PVA/n-Si Heterojunction Diode
Using spin coating, a PEDOT:PSS-PVA/n-Si device has been fabricated by depositing the composite of conducting polymer PEDOT:PSS and poly(vinyl alcohol) on n-Si substrate. The current-voltage measurements of the device have been evaluated at room temperature in dark. The PEDOT:PSSPVA/ n-Si structure demonstrated the rectifying behavior. The various electronic parameters such as rectification ratio, turn on voltage, ideality factor, reverse saturation current, barrier height, series and shunt resistances were extracted from the IV characteristics of this diode. The values of ideality factor and series resistance were also verified by using Cheung functions. In addition, the conduction mechanism in the device was also investigated by I-V curves.
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