{"title":"用于细间距互连的x射线层析检查的动画界面","authors":"S. Black, D. Millard, K. Nilson","doi":"10.1109/IEMT.1991.279778","DOIUrl":null,"url":null,"abstract":"While the function of solder joint inspection is to assess joint quality, evolving fine-pitch mounting technologies have made some electronic assemblies impossible to inspect using human-oriented visual techniques. A group of automated inspection tools has recently been developed in response to this need, one of which uses X-ray laminography in conjunction with very elaborate software. The authors present the work that has been performed to provide an easy-to-use animated graphics-oriented, X-ray laminographic solder joint inspection system interface. The interface has been developed to aid in the study of performance-related interconnect inspection.<<ETX>>","PeriodicalId":127257,"journal":{"name":"[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"An animated interface for X-ray laminographic inspection of fine-pitch interconnect\",\"authors\":\"S. Black, D. Millard, K. Nilson\",\"doi\":\"10.1109/IEMT.1991.279778\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"While the function of solder joint inspection is to assess joint quality, evolving fine-pitch mounting technologies have made some electronic assemblies impossible to inspect using human-oriented visual techniques. A group of automated inspection tools has recently been developed in response to this need, one of which uses X-ray laminography in conjunction with very elaborate software. The authors present the work that has been performed to provide an easy-to-use animated graphics-oriented, X-ray laminographic solder joint inspection system interface. The interface has been developed to aid in the study of performance-related interconnect inspection.<<ETX>>\",\"PeriodicalId\":127257,\"journal\":{\"name\":\"[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-09-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.1991.279778\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1991.279778","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An animated interface for X-ray laminographic inspection of fine-pitch interconnect
While the function of solder joint inspection is to assess joint quality, evolving fine-pitch mounting technologies have made some electronic assemblies impossible to inspect using human-oriented visual techniques. A group of automated inspection tools has recently been developed in response to this need, one of which uses X-ray laminography in conjunction with very elaborate software. The authors present the work that has been performed to provide an easy-to-use animated graphics-oriented, X-ray laminographic solder joint inspection system interface. The interface has been developed to aid in the study of performance-related interconnect inspection.<>