K. Label, A. Moran, C. Seidleck, E. Stassinopoulos, J. Barth, P. Marshall, M. Carts, C. Marshall, J. Kinnison, B. Carkhuff
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Single event effect test results for candidate spacecraft electronics
We present both heavy ion and proton single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital, analog, and fiber optic devices were tested, including DRAMs, FPGAs and fiber links.