当前多端口sram的方向检测技术

Masanori Izumikawa, M. Yamashina
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引用次数: 29

摘要

对于多端口sram来说,不需要参考电压的单端检测放大器是最理想的。本文介绍了一种将电流方向转换为逻辑值的电流方向检测电路。它的运行速度比CMOS逆变器快4倍,并且有了它,可以生产单端200 MHz 64 Kb sram,其总功耗几乎与传统sram中仅存储单元电流所需的功耗一样低。本文还提出了一种写入位线摆动控制电路,该电路利用存储单元副本来减少位线和字行摆动。当该电路应用于200 MHz 64 Kb SRAM时,可以将位线驱动和伪读单元电流(0.25 /spl mu/m CMOS)所需的功耗降低三分之一。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A current direction sense technique for multi-port SRAMs
Single-end sense amplifiers which do not require a reference voltage would be most desirable for multi-port SRAMs. This paper describes a current-direction sense circuit which transforms current direction into a logic value. It operates 4 times faster than a CMOS inverter, and with it it is possible to produce single-end 200 MHz 64 Kb SRAMs whose total power consumption is nearly as low as that required for the memory cell currents alone in conventional SRAMs. Also presented is a write bit-line swing control circuit which uses a memory cell replica to reduce bit-line and word-line swing. When this circuit is applied to be used in a 200 MHz 64 Kb SRAM, it is possible to reduce by one-third the power consumption required for bit-line driving and pseudo-read cell current (0.25 /spl mu/m CMOS).
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