S. Tsuji, R. Suzuki, Y. Tsuchiya, T. Taniwatari, Y. Ono
{"title":"工作在1.48/spl μ m的压缩应变MQW-BH激光器波导损耗的势垒厚度依赖性","authors":"S. Tsuji, R. Suzuki, Y. Tsuchiya, T. Taniwatari, Y. Ono","doi":"10.1109/ISLC.1992.763567","DOIUrl":null,"url":null,"abstract":"Barrier thickness dependence of the waveguide loss for compressive strained MQW waveguides is investigated experimentally. The waveguide loss is found to be greatly decreased in thin (6nm) barrier, compressively strained MQW-BH lasers.","PeriodicalId":207712,"journal":{"name":"13th IEEE International Semiconductor Laser Conference","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Barrier thickness dependence of waveguide loss for compressively strained MQW-BH lasers operating at 1.48/spl mu/m\",\"authors\":\"S. Tsuji, R. Suzuki, Y. Tsuchiya, T. Taniwatari, Y. Ono\",\"doi\":\"10.1109/ISLC.1992.763567\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Barrier thickness dependence of the waveguide loss for compressive strained MQW waveguides is investigated experimentally. The waveguide loss is found to be greatly decreased in thin (6nm) barrier, compressively strained MQW-BH lasers.\",\"PeriodicalId\":207712,\"journal\":{\"name\":\"13th IEEE International Semiconductor Laser Conference\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-09-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"13th IEEE International Semiconductor Laser Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISLC.1992.763567\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"13th IEEE International Semiconductor Laser Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISLC.1992.763567","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Barrier thickness dependence of waveguide loss for compressively strained MQW-BH lasers operating at 1.48/spl mu/m
Barrier thickness dependence of the waveguide loss for compressive strained MQW waveguides is investigated experimentally. The waveguide loss is found to be greatly decreased in thin (6nm) barrier, compressively strained MQW-BH lasers.