寄生双极效应的影响及软误差趋势

2013 IEEE International Reliability Physics Symposium (IRPS) Pub Date : 2013-04-14 DOI:10.1109/IRPS.2013.6532054

T. Uemura, T. Kato, H. Matsuyama

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引用次数: 7

摘要

通过散裂中子束辐照试验，研究了寄生双极作用对地面环境中28nm序列元件的影响。通过对触发器和ram的中子试验，讨论寄生双极作用对SER技术发展的贡献。

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Impact of parasitic bipolar action and soft-error trend in bulk CMOS at terrestrial environment

We investigate an impact of parasitic bipolar action on 28nm sequential elements in the terrestrial environment through spallation neutron beam irradiation tests. We discuss the contribution of parasitic bipolar action to the technology trend of SER through neutron tests on Flip-Flops and SRAMs.

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2013 IEEE International Reliability Physics Symposium (IRPS)

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