T. Nishioka, M. Nagasaqa, K. Igarashi, M. Kohmoto, S. Ito
{"title":"表面贴装装置用成型化合物的特殊性能","authors":"T. Nishioka, M. Nagasaqa, K. Igarashi, M. Kohmoto, S. Ito","doi":"10.1109/ECTC.1990.122253","DOIUrl":null,"url":null,"abstract":"An equation was developed for use in the design of a molding compound with increased resistance to the popcorn (package cracking) phenomenon. After evaluating many kinds of raw materials to achieve the goal, the authors chose two resin systems; one resin system is low glass transition temperature, Tg, while the other is high T/sub g/. High-density filling with silica helped improve the antipopcorn properties. It is concluded that low-Tg molding compounds have obvious advantages over high-Tg molding compounds in terms of the antipopcorn property. From this study, the authors recommend low-Tg molding compounds that have low-S, low-E, low-Df, and high- sigma properties to protect surface-mount devices from the popcorn phenomenon.<<ETX>>","PeriodicalId":102875,"journal":{"name":"40th Conference Proceedings on Electronic Components and Technology","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":"{\"title\":\"Special properties of molding compound for surface mounting devices\",\"authors\":\"T. Nishioka, M. Nagasaqa, K. Igarashi, M. Kohmoto, S. Ito\",\"doi\":\"10.1109/ECTC.1990.122253\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An equation was developed for use in the design of a molding compound with increased resistance to the popcorn (package cracking) phenomenon. After evaluating many kinds of raw materials to achieve the goal, the authors chose two resin systems; one resin system is low glass transition temperature, Tg, while the other is high T/sub g/. High-density filling with silica helped improve the antipopcorn properties. It is concluded that low-Tg molding compounds have obvious advantages over high-Tg molding compounds in terms of the antipopcorn property. From this study, the authors recommend low-Tg molding compounds that have low-S, low-E, low-Df, and high- sigma properties to protect surface-mount devices from the popcorn phenomenon.<<ETX>>\",\"PeriodicalId\":102875,\"journal\":{\"name\":\"40th Conference Proceedings on Electronic Components and Technology\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"21\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"40th Conference Proceedings on Electronic Components and Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.1990.122253\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"40th Conference Proceedings on Electronic Components and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1990.122253","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Special properties of molding compound for surface mounting devices
An equation was developed for use in the design of a molding compound with increased resistance to the popcorn (package cracking) phenomenon. After evaluating many kinds of raw materials to achieve the goal, the authors chose two resin systems; one resin system is low glass transition temperature, Tg, while the other is high T/sub g/. High-density filling with silica helped improve the antipopcorn properties. It is concluded that low-Tg molding compounds have obvious advantages over high-Tg molding compounds in terms of the antipopcorn property. From this study, the authors recommend low-Tg molding compounds that have low-S, low-E, low-Df, and high- sigma properties to protect surface-mount devices from the popcorn phenomenon.<>