{"title":"处理器控制子系统中性能故障的低成本、基于软件的自检方法","authors":"S. Almukhaizim, Peter Petrov, A. Orailoglu","doi":"10.1109/CICC.2001.929769","DOIUrl":null,"url":null,"abstract":"A software-based testing methodology for processor control subsystems, targeting hard-to-test performance faults in high-end embedded and general-purpose processors, is presented. An algorithm for directly controlling, using the instruction-set architecture only, the branch-prediction logic, a representative example of the class of processor control subsystems particularly prone to such performance faults, is outlined. Experimental results confirm the viability of the proposed methodology as a low-cost and effective answer to the problem of hard-to-test performance faults in processor architectures.","PeriodicalId":101717,"journal":{"name":"Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"Low-cost, software-based self-test methodologies for performance faults in processor control subsystems\",\"authors\":\"S. Almukhaizim, Peter Petrov, A. Orailoglu\",\"doi\":\"10.1109/CICC.2001.929769\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A software-based testing methodology for processor control subsystems, targeting hard-to-test performance faults in high-end embedded and general-purpose processors, is presented. An algorithm for directly controlling, using the instruction-set architecture only, the branch-prediction logic, a representative example of the class of processor control subsystems particularly prone to such performance faults, is outlined. Experimental results confirm the viability of the proposed methodology as a low-cost and effective answer to the problem of hard-to-test performance faults in processor architectures.\",\"PeriodicalId\":101717,\"journal\":{\"name\":\"Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169)\",\"volume\":\"63 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-05-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.2001.929769\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2001.929769","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Low-cost, software-based self-test methodologies for performance faults in processor control subsystems
A software-based testing methodology for processor control subsystems, targeting hard-to-test performance faults in high-end embedded and general-purpose processors, is presented. An algorithm for directly controlling, using the instruction-set architecture only, the branch-prediction logic, a representative example of the class of processor control subsystems particularly prone to such performance faults, is outlined. Experimental results confirm the viability of the proposed methodology as a low-cost and effective answer to the problem of hard-to-test performance faults in processor architectures.