半导体激光二极管微波散射参数对寄生特性的表征

The 2012 International Workshop on Microwave and Millimeter Wave Circuits and System Technology Pub Date : 2012-04-19 DOI:10.1109/MMWCST.2012.6238149

Shang-jian Zhang, Xiaobin Bao, R. Lu, Shuang Liu, Xiao-xia Zhang, Yong Liu

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引用次数: 0

摘要

提出了一种通过测量半导体激光二极管的散射参数来表征其寄生特性的新方法。利用该方法设计并进行了实验，进一步研究了寄生元件对半导体激光二极管寄生特性的影响。我们的方法只需要测量半导体激光二极管的反射系数，由于微波测量技术的发展，该方法简单。

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Characterization of parasitics from microwave scattering parameters of semiconductor laser diode

We proposed A novel method for characterizing the parasitics of semiconductor laser diode through measuring its scattering parameters. Experiments are designed and performed using our method, and furthermore, how the parasitic element affects the parasitics of semiconductor laser diodes is investigated. Our method only needs reflection coefficient of semiconductor laser diode to be measured, which is simple due to the developed microwave measurement techniques.

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The 2012 International Workshop on Microwave and Millimeter Wave Circuits and System Technology

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