Ah-Lyan Yee, R. Gu, Heng-Chih-Lin, A. Tsong, R. Prentice, J. Tran, R. Venett, S. Spencer, V. Pathak, E. Suder, M. Izzard
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An integratable 1-2.5 Gbps low jitter CMOS transceiver with built in self test capability
This paper describes a high speed, low jitter CMOS transceiver, which includes 10 to 1 full duplex serialize-deserialize function, clock recovery, high speed differential I/O, and Built In Self Test (BIST). It was fabricated and tested to work at wide frequency range (1 to 2.5 Gbps) with low jitter and low power (76 ps P-P, 500 mW @ 2.5 Gbps). It was designed to be a component of ASIC standard cell library and was implemented as a stand alone design as well as in a large design with 32 transceivers.