一种带18.3 dBm Psat和15.4% PAE的130纳米SiGe BiCMOS w波段宽带功率放大器

Jialong Wan, Jiang Luo, Han Sun, Shi Chen, Jin He
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引用次数: 0

摘要

提出了一种采用130 nm SiGe BiCMOS技术设计的两级宽带w波段功率放大器。通过采用增益分布技术,增益放大器在宽带宽(BW)上提供平坦的增益响应。该放大器通过并联多个小尺寸晶体管实现高饱和输出功率$(P_{\ mathm {s}\ mathm {a}\ mathm {t}})$和功率附加效率(PAE)。仿真结果表明,该放大器在88 GHz时的峰值增益为22.3 dB, 3db BW为29.2 GHz。在94 GHz时,模拟的$P_{\ mathm {s}\ mathm {a}\ mathm {t}}$和峰值PAE分别为18.3 dBm和15.4%。这种性能对于基于SiGe异质结双极晶体管(HBT)的单端PA来说是非常优秀的。PA的小芯片尺寸,包括所有的测试垫,只有500美元× 620美元。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A W-Band Wideband Power Amplifier with 18.3 dBm Psat and 15.4% PAE in 130-nm SiGe BiCMOS
This paper presents a two-stage wideband W-band power amplifier (PA) designed in 130 nm SiGe BiCMOS technology. By employing the gain-distribution technique, the PA delivers a flat gain response over a wide bandwidth (BW). The proposed PA achieves high saturated output power $(P_{\mathrm{s}\mathrm{a}\mathrm{t}})$ and power-added efficiency (PAE) by paralleling multiple small-sized transistors. According to the simulated results, the PA exhibits a peak gain of 22.3 dB at 88 GHz with a 3-dB BW of 29.2 GHz. At 94 GHz, the simulated $P_{\mathrm{s}\mathrm{a}\mathrm{t}}$ and the peak PAE are 18.3 dBm and 15.4%, respectively. Such performances are excellent for a single-ended PA based on the SiGe heterojunction bipolar transistor (HBT). The small chip size of the PA, including all testing pads, is only $500\times 620\mu \mathrm{m}^{2}$.
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