大功率QCW毫米棒阵列的可靠性

2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2009-07-06 DOI:10.1109/IPFA.2009.5232648

L. Guoguang, Huang Yun, En Yunfei, Yang Shaohua, Lei Zhifeng

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引用次数: 0

摘要

我们在此报告了使用自动化二极管阵列可靠性实验对10个高功率cm-bar阵列的寿命测试。该器件在25°C/100A条件下进行测试，脉冲宽度为200µs，占空因数为2%。大多数设备存活时间超过1.0×109次。对少数失效装置的失效分析结果揭示了机械应力、化学污染和热迁移的失效模式。

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Reliability of high power QCW cm-bar arrays

We report here the lifetime testing of 10 high power cm-bar arrays using an automated diode array reliability experiment. The devices are tested at 25°C/100A, with a pulse width of 200µs and a duty factor of 2%. Most devices survive more than 1.0×109 shots. Failure analysis results on the few failing devices reveal failure modes of mechanical stress, chemical contamination and thermal migration.

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来源期刊

2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

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