D. Goren, M. Zelikson, R. Gordin, I. Wagner, A. Barger, Alon Amir, B. Livshitz, Anatoly Sherman, Y. Tretiakov, R. Groves, J. Park, D. Jordan, Sue E. Strang, Raminderpal Singh, C. Dickey, D. Harame
{"title":"基于高带宽传输线器件的片上互连感知设计与建模方法","authors":"D. Goren, M. Zelikson, R. Gordin, I. Wagner, A. Barger, Alon Amir, B. Livshitz, Anatoly Sherman, Y. Tretiakov, R. Groves, J. Park, D. Jordan, Sue E. Strang, Raminderpal Singh, C. Dickey, D. Harame","doi":"10.1145/775832.776017","DOIUrl":null,"url":null,"abstract":"This paper expands the on-chip interconnect-aware methodology for high-speed analog and mixed signal design, presented in D. Goren et al. (2002), into a wider class of designs, including dense layout CMOS design. The proposed solution employs a set of parameterized on-chip transmission line (T-line) devices for the critical interconnects, which is expanded to include coplanar structures while considering the silicon substrate effect. The generalized methodology contains treatment of the crossing line effects at the various design stages, including two way interactions between the post layout extraction tool and the T-line devices. The T-line device models are passive by construction, easily migratable among design environments, and allow for both time and frequency domain simulations. These models are verified by S-parameter measurements up to 110GHz, as well as by EM solver results. It is experimentally shown that the effect of properly designed discontinuities is negligible in most practical cases. The basic on-chip T-line methodology is being used extensively for numerous high-speed designs.","PeriodicalId":167477,"journal":{"name":"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)","volume":"178 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"30","resultStr":"{\"title\":\"On-chip interconnect-aware design and modeling methodology based on high bandwidth transmission line devices\",\"authors\":\"D. Goren, M. Zelikson, R. Gordin, I. Wagner, A. Barger, Alon Amir, B. Livshitz, Anatoly Sherman, Y. Tretiakov, R. Groves, J. Park, D. Jordan, Sue E. Strang, Raminderpal Singh, C. Dickey, D. Harame\",\"doi\":\"10.1145/775832.776017\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper expands the on-chip interconnect-aware methodology for high-speed analog and mixed signal design, presented in D. Goren et al. (2002), into a wider class of designs, including dense layout CMOS design. The proposed solution employs a set of parameterized on-chip transmission line (T-line) devices for the critical interconnects, which is expanded to include coplanar structures while considering the silicon substrate effect. The generalized methodology contains treatment of the crossing line effects at the various design stages, including two way interactions between the post layout extraction tool and the T-line devices. The T-line device models are passive by construction, easily migratable among design environments, and allow for both time and frequency domain simulations. These models are verified by S-parameter measurements up to 110GHz, as well as by EM solver results. It is experimentally shown that the effect of properly designed discontinuities is negligible in most practical cases. The basic on-chip T-line methodology is being used extensively for numerous high-speed designs.\",\"PeriodicalId\":167477,\"journal\":{\"name\":\"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)\",\"volume\":\"178 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-06-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"30\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/775832.776017\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/775832.776017","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On-chip interconnect-aware design and modeling methodology based on high bandwidth transmission line devices
This paper expands the on-chip interconnect-aware methodology for high-speed analog and mixed signal design, presented in D. Goren et al. (2002), into a wider class of designs, including dense layout CMOS design. The proposed solution employs a set of parameterized on-chip transmission line (T-line) devices for the critical interconnects, which is expanded to include coplanar structures while considering the silicon substrate effect. The generalized methodology contains treatment of the crossing line effects at the various design stages, including two way interactions between the post layout extraction tool and the T-line devices. The T-line device models are passive by construction, easily migratable among design environments, and allow for both time and frequency domain simulations. These models are verified by S-parameter measurements up to 110GHz, as well as by EM solver results. It is experimentally shown that the effect of properly designed discontinuities is negligible in most practical cases. The basic on-chip T-line methodology is being used extensively for numerous high-speed designs.