基于不同CMOS技术的6T SRAM单元设计与性能分析

Sd Nageena Parveen, V. Charishma, P. Summit, A. Sandeep, R. S. Rahul
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摘要

静态随机存取存储器(SRAM)由于其特殊的数据存储能力,已成为超大规模集成电路和片上系统的关键存储技术。sram由于其巨大的存储容量、快速访问时间和低功耗要求而经常被使用。由于内存占芯片的60% ~ 70%,SRAM的优化成为研究的热点。在这个项目中,我们正在尝试利用各种CMOS技术、数字原理图和微风工具设计和实现一个6T SRAM。因为6T SRAM更实用。在这里,我们从写延迟、读延迟、功耗和平均延迟方面评估SRAM的性能,以确定哪种技术最有利。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design and Performance Analysis of 6T SRAM Cell on Different CMOS Technologies
Due to its special capacity to store data, static random-access memory (SRAM) has been a crucial memory technology in VLSI circuits and on System on Chip. SRAMs are frequently employed due to their enormous store capacity, quick access times, and low power requirements. Due to the fact that memories take up 60% to 70% of a chip, SRAM optimization has become a focus of research. We are attempting to design and implement a 6T SRAM in this project utilizing various CMOS technologies and the digital schematic and micro wind tool. As 6T SRAM is more practical to employ. Here, we evaluate SRAM’s performance in terms of Write delay, Read delay, Power Dissipation, and Average delay in order to determine which technology is the most advantageous.
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