Jaehyuk Park, Dongwook Lee, Jongmyung Yoo, H. Hwang
{"title":"基于NbO2的阈值开关器件,具有高工作温度(>85°C),用于陡坡MOSFET (~ 2mV/dec),具有超低电压工作和改进的延迟时间","authors":"Jaehyuk Park, Dongwook Lee, Jongmyung Yoo, H. Hwang","doi":"10.1109/IEDM.2017.8268449","DOIUrl":null,"url":null,"abstract":"To realize a steep slope field-effect transistor (FET) with low leakage current and controllable operating bias, NbO2 threshold switching (TS) device is connected in series with the gate side of a MOSFET. Thanks to the TS device showing abrupt transition between the OFF and ON states at threshold voltage (Vth), the implemented transistor exhibits extremely low leakage current (10<sup>−7</sup>μA/μm), high I<inf>on</inf>/I<inf>off</inf> ratio (>10<sup>6</sup>), sub-2 mV/dec subthreshold swing, drift-free characteristic and high temperature operation (>85°C). Furthermore, since the Vth is tunable by controlling thickness of the NbO<inf>2</inf> TS device, the new NbO<inf>2</inf>-MOSFET can fulfill various demands of operating bias conditions. In addition, we confirmed through a simulation that the CMOS inverter with NbO<inf>2</inf> connected to the gate side showed fast inverting speed of over 300 MHz at ultra-low voltage (<0.3V), improved propagation delay time by x3.0 and reduced operation V<inf>d</inf> (ΔV>200mV).","PeriodicalId":412333,"journal":{"name":"2017 IEEE International Electron Devices Meeting (IEDM)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"NbO2 based threshold switch device with high operating temperature (>85°C) for steep-slope MOSFET (∼2mV/dec) with ultra-low voltage operation and improved delay time\",\"authors\":\"Jaehyuk Park, Dongwook Lee, Jongmyung Yoo, H. Hwang\",\"doi\":\"10.1109/IEDM.2017.8268449\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To realize a steep slope field-effect transistor (FET) with low leakage current and controllable operating bias, NbO2 threshold switching (TS) device is connected in series with the gate side of a MOSFET. Thanks to the TS device showing abrupt transition between the OFF and ON states at threshold voltage (Vth), the implemented transistor exhibits extremely low leakage current (10<sup>−7</sup>μA/μm), high I<inf>on</inf>/I<inf>off</inf> ratio (>10<sup>6</sup>), sub-2 mV/dec subthreshold swing, drift-free characteristic and high temperature operation (>85°C). Furthermore, since the Vth is tunable by controlling thickness of the NbO<inf>2</inf> TS device, the new NbO<inf>2</inf>-MOSFET can fulfill various demands of operating bias conditions. In addition, we confirmed through a simulation that the CMOS inverter with NbO<inf>2</inf> connected to the gate side showed fast inverting speed of over 300 MHz at ultra-low voltage (<0.3V), improved propagation delay time by x3.0 and reduced operation V<inf>d</inf> (ΔV>200mV).\",\"PeriodicalId\":412333,\"journal\":{\"name\":\"2017 IEEE International Electron Devices Meeting (IEDM)\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-12-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE International Electron Devices Meeting (IEDM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2017.8268449\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2017.8268449","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
NbO2 based threshold switch device with high operating temperature (>85°C) for steep-slope MOSFET (∼2mV/dec) with ultra-low voltage operation and improved delay time
To realize a steep slope field-effect transistor (FET) with low leakage current and controllable operating bias, NbO2 threshold switching (TS) device is connected in series with the gate side of a MOSFET. Thanks to the TS device showing abrupt transition between the OFF and ON states at threshold voltage (Vth), the implemented transistor exhibits extremely low leakage current (10−7μA/μm), high Ion/Ioff ratio (>106), sub-2 mV/dec subthreshold swing, drift-free characteristic and high temperature operation (>85°C). Furthermore, since the Vth is tunable by controlling thickness of the NbO2 TS device, the new NbO2-MOSFET can fulfill various demands of operating bias conditions. In addition, we confirmed through a simulation that the CMOS inverter with NbO2 connected to the gate side showed fast inverting speed of over 300 MHz at ultra-low voltage (<0.3V), improved propagation delay time by x3.0 and reduced operation Vd (ΔV>200mV).