Y. Aguiar, N. Medina, N. Added, E. Macchione, S. G. Nascimento, A. R. Leite, M. Silveira
{"title":"南美SEE测量的新设置","authors":"Y. Aguiar, N. Medina, N. Added, E. Macchione, S. G. Nascimento, A. R. Leite, M. Silveira","doi":"10.1109/RADECS.2017.8696206","DOIUrl":null,"url":null,"abstract":"The new setup for Single Event Effects studies at LAFN-USP, Brazil is described in this work. The new beam line is dedicated to production of large area, high uniformity and low intensity heavy-ions beams to irradiate electronic devices. Its design relies on defocusing and multiple scattering techniques to obtain desired beam characteristics. Beam uniformity measured was better than 90%.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"New Setup for SEE Measurements in South America\",\"authors\":\"Y. Aguiar, N. Medina, N. Added, E. Macchione, S. G. Nascimento, A. R. Leite, M. Silveira\",\"doi\":\"10.1109/RADECS.2017.8696206\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The new setup for Single Event Effects studies at LAFN-USP, Brazil is described in this work. The new beam line is dedicated to production of large area, high uniformity and low intensity heavy-ions beams to irradiate electronic devices. Its design relies on defocusing and multiple scattering techniques to obtain desired beam characteristics. Beam uniformity measured was better than 90%.\",\"PeriodicalId\":223580,\"journal\":{\"name\":\"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADECS.2017.8696206\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.2017.8696206","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The new setup for Single Event Effects studies at LAFN-USP, Brazil is described in this work. The new beam line is dedicated to production of large area, high uniformity and low intensity heavy-ions beams to irradiate electronic devices. Its design relies on defocusing and multiple scattering techniques to obtain desired beam characteristics. Beam uniformity measured was better than 90%.