{"title":"基于电流的带隙基准电压自动校准技术","authors":"U. Chi-Wa, M. Law, C. Lam, R. Martins","doi":"10.1109/A-SSCC53895.2021.9634776","DOIUrl":null,"url":null,"abstract":"For the industrial application, the bandgap voltage reference (BGR) requires calibration after fabrication to ensure accuracy [1–3] which may lead to expensive labor costs. Some BGRs in the literature were reported without trimming [4,5], however, their output voltages will drift due to device aging and stress [6]. The proposed auto-calibration technique can eliminate such a process thus saving costs. Furthermore, the $\\beta$ of the BJT is small in the advance process such that the variation of $\\beta/(\\beta+1)$ in $V_{EB}=(kT/q)\\ln[(I_{E}/I_{S})\\beta/(\\beta+1)]$ has a great influence on VEB, resulting in residual temperature coefficient (TC) variation after the conventional one-point trimming. This implies an error in the output, thus reduce stability and lifetime of the system.","PeriodicalId":286139,"journal":{"name":"2021 IEEE Asian Solid-State Circuits Conference (A-SSCC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Auto-Calibration Technique for Current-Based Bandgap Voltage Reference\",\"authors\":\"U. Chi-Wa, M. Law, C. Lam, R. Martins\",\"doi\":\"10.1109/A-SSCC53895.2021.9634776\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For the industrial application, the bandgap voltage reference (BGR) requires calibration after fabrication to ensure accuracy [1–3] which may lead to expensive labor costs. Some BGRs in the literature were reported without trimming [4,5], however, their output voltages will drift due to device aging and stress [6]. The proposed auto-calibration technique can eliminate such a process thus saving costs. Furthermore, the $\\\\beta$ of the BJT is small in the advance process such that the variation of $\\\\beta/(\\\\beta+1)$ in $V_{EB}=(kT/q)\\\\ln[(I_{E}/I_{S})\\\\beta/(\\\\beta+1)]$ has a great influence on VEB, resulting in residual temperature coefficient (TC) variation after the conventional one-point trimming. This implies an error in the output, thus reduce stability and lifetime of the system.\",\"PeriodicalId\":286139,\"journal\":{\"name\":\"2021 IEEE Asian Solid-State Circuits Conference (A-SSCC)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-11-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE Asian Solid-State Circuits Conference (A-SSCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/A-SSCC53895.2021.9634776\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Asian Solid-State Circuits Conference (A-SSCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/A-SSCC53895.2021.9634776","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Auto-Calibration Technique for Current-Based Bandgap Voltage Reference
For the industrial application, the bandgap voltage reference (BGR) requires calibration after fabrication to ensure accuracy [1–3] which may lead to expensive labor costs. Some BGRs in the literature were reported without trimming [4,5], however, their output voltages will drift due to device aging and stress [6]. The proposed auto-calibration technique can eliminate such a process thus saving costs. Furthermore, the $\beta$ of the BJT is small in the advance process such that the variation of $\beta/(\beta+1)$ in $V_{EB}=(kT/q)\ln[(I_{E}/I_{S})\beta/(\beta+1)]$ has a great influence on VEB, resulting in residual temperature coefficient (TC) variation after the conventional one-point trimming. This implies an error in the output, thus reduce stability and lifetime of the system.