用于高性能低功耗应用的10nm以下高k介电SOI-FinFET

Ajay Kumar, Shankul Saini, Abhisht Gupta, N. Gupta, M. M. Tripathi, R. Chaujar
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引用次数: 1

摘要

在这项工作中,研究了在非常低的电源下,用于高性能模拟应用的低于10 nm高k介电绝缘体上硅(SOI) FinFET。对9nm栅长高k SOI-FinFET与传统FinFET的性能进行了比较分析。经评估,所提出的器件在更好的亚阈值斜率、降低阈值电压、器件效率和更高的开关比(离子/开关比)方面提供了更好的解决方案。因此,高k介电SOI-FinFET器件为高性能开关应用铺平了道路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Sub-10 nm High-k Dielectric SOI-FinFET for HighPerformance Low Power Applications
In this work, sub-10 nm high-k dielectric Silicon-on-Insulator (SOI) FinFET has been investigated for high-performance analog applications with a very low power supply. The performance analysis of 9 nm gate length high-k SOI-FinFET has been compared with conventional FinFET. It has been evaluated that the proposed device provides better solutions in terms of better subthreshold slope, lowering of threshold voltage, device efficiency, and higher switching ratio (Ion/Ioff ratio). Thus, the high-k dielectric SOI-FinFET device paves the way for high-performance switching applications.
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