E. Gawish, M. El-Kharashi, Mohamed Fathy Abu Elyazeed
{"title":"可变容错NoC链路设计","authors":"E. Gawish, M. El-Kharashi, Mohamed Fathy Abu Elyazeed","doi":"10.1145/2401716.2401729","DOIUrl":null,"url":null,"abstract":"In this paper we propose a model for the design of Networks-on-Chip (NoC) links that takes into considerations the systematic and random effects of process variability. The model predicts the delay variations of each NoC link in a floor-plan. Delay variations are used to modify the link design parameters, like the optimal number of buffered sections and their gains, to meet the delay constraints in a more variability-tolerant way. The proposed technique is tested using test cases of 4x4 meshes at 65 nm, 45nm, 32nm, and 22 nm technologies. Results show that the delay variations approach 10% of the total link delay and the total power cost using our technique is up to 33% compared to the nominal delay and power values in the absence of random and systematic variations effects. Yet our methodology has a lower power cost compared to the worst-case design, saving up to 28% of the total power consumption in the test case of the 4x4 mesh at 45 nm.","PeriodicalId":344147,"journal":{"name":"Network on Chip Architectures","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Variability-tolerant NoC link design\",\"authors\":\"E. Gawish, M. El-Kharashi, Mohamed Fathy Abu Elyazeed\",\"doi\":\"10.1145/2401716.2401729\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we propose a model for the design of Networks-on-Chip (NoC) links that takes into considerations the systematic and random effects of process variability. The model predicts the delay variations of each NoC link in a floor-plan. Delay variations are used to modify the link design parameters, like the optimal number of buffered sections and their gains, to meet the delay constraints in a more variability-tolerant way. The proposed technique is tested using test cases of 4x4 meshes at 65 nm, 45nm, 32nm, and 22 nm technologies. Results show that the delay variations approach 10% of the total link delay and the total power cost using our technique is up to 33% compared to the nominal delay and power values in the absence of random and systematic variations effects. Yet our methodology has a lower power cost compared to the worst-case design, saving up to 28% of the total power consumption in the test case of the 4x4 mesh at 45 nm.\",\"PeriodicalId\":344147,\"journal\":{\"name\":\"Network on Chip Architectures\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Network on Chip Architectures\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2401716.2401729\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Network on Chip Architectures","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2401716.2401729","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this paper we propose a model for the design of Networks-on-Chip (NoC) links that takes into considerations the systematic and random effects of process variability. The model predicts the delay variations of each NoC link in a floor-plan. Delay variations are used to modify the link design parameters, like the optimal number of buffered sections and their gains, to meet the delay constraints in a more variability-tolerant way. The proposed technique is tested using test cases of 4x4 meshes at 65 nm, 45nm, 32nm, and 22 nm technologies. Results show that the delay variations approach 10% of the total link delay and the total power cost using our technique is up to 33% compared to the nominal delay and power values in the absence of random and systematic variations effects. Yet our methodology has a lower power cost compared to the worst-case design, saving up to 28% of the total power consumption in the test case of the 4x4 mesh at 45 nm.