Y. Ren, L. Chen, S. Shi, G. Guo, R. Feng, S. Wen, R. Wong, N. V. van Vonno, B. Bhuva
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Single-event transient measurement on a DC/DC PWM controller using Pulsed X-ray technique
Pulsed X-rays were used to perform Single-Event Transient (SET) measurements on a COTS DC/DC PWM controller. The results were consistent with those of the previous heavy ion and pulsed laser testings, which indicates that the pulsed X-ray technique is a complementary tool to investigate SET. However, there are some limitations, such as low energy absorption of X-rays in silicon and total ionizing dose (TID) effects due to the X-ray irradiation, which need to be considered during X-ray applications.
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