FFT处理器并发故障检测方案

Proceedings Sixth Asian Test Symposium (ATS'97) Pub Date : 1997-11-17 DOI:10.1109/ATS.1997.643928

M. Tsunoyama, M. Uenoyama, T. Kabasawa

{"title":"FFT处理器并发故障检测方案","authors":"M. Tsunoyama, M. Uenoyama, T. Kabasawa","doi":"10.1109/ATS.1997.643928","DOIUrl":null,"url":null,"abstract":"This paper proposes a concurrent fault-detection scheme for FFT processors. In the scheme, fault detection is made by comparing the pair of outputs from butterfly units based on the FFT algorithm. The hardware overhead for the scheme is O(N) where N is the number of input data. This scheme requires no extra computations for locating a pair of faulty butterfly units, therefore, the scheme can be used for highly reliable real-time systems.","PeriodicalId":330767,"journal":{"name":"Proceedings Sixth Asian Test Symposium (ATS'97)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A concurrent fault-detection scheme for FFT processors\",\"authors\":\"M. Tsunoyama, M. Uenoyama, T. Kabasawa\",\"doi\":\"10.1109/ATS.1997.643928\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a concurrent fault-detection scheme for FFT processors. In the scheme, fault detection is made by comparing the pair of outputs from butterfly units based on the FFT algorithm. The hardware overhead for the scheme is O(N) where N is the number of input data. This scheme requires no extra computations for locating a pair of faulty butterfly units, therefore, the scheme can be used for highly reliable real-time systems.\",\"PeriodicalId\":330767,\"journal\":{\"name\":\"Proceedings Sixth Asian Test Symposium (ATS'97)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Sixth Asian Test Symposium (ATS'97)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1997.643928\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Sixth Asian Test Symposium (ATS'97)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1997.643928","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

提出了一种用于FFT处理器的并发故障检测方案。在该方案中，基于FFT算法，通过比较蝶形单元的输出对来进行故障检测。该方案的硬件开销是O(N)，其中N是输入数据的数量。该方案不需要额外的计算来定位一对故障的蝶形单元，因此，该方案可用于高可靠的实时系统。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A concurrent fault-detection scheme for FFT processors

This paper proposes a concurrent fault-detection scheme for FFT processors. In the scheme, fault detection is made by comparing the pair of outputs from butterfly units based on the FFT algorithm. The hardware overhead for the scheme is O(N) where N is the number of input data. This scheme requires no extra computations for locating a pair of faulty butterfly units, therefore, the scheme can be used for highly reliable real-time systems.

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Proceedings Sixth Asian Test Symposium (ATS'97)

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