模拟参数对临界区域分析的影响

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) Pub Date : 1999-11-01 DOI:10.1109/DFTVS.1999.802864

J. Segal, S. Bakarian, R. Ross

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引用次数: 2

摘要

蒙特卡罗临界区域提取程序是由一系列影响仿真精度和速度的参数控制的。本文通过实验探讨了缺陷形状、布局中圆角、冗余触点合并、考虑从布局中提取的网表以及改变模拟缺陷数量等参数对仿真结果的影响。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Impact of simulation parameters on critical area analysis

Monte Carlo critical area extraction routines are controlled by a number of parameters that impact the accuracy and speed of the simulation. In this paper, the effects of the following parameters are explored experimentally: defect shape, rounding of corners in the layout, merging of redundant contacts, consideration of the netlist extracted from layout, and varying the number of defects simulated.

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Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)

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