Ye.P. Taran, V. Starostenko, Ye.V. Grygoriev, D.E. Lashennikov
{"title":"电磁场作用下电镀集成电路中的电流分布和热局部化","authors":"Ye.P. Taran, V. Starostenko, Ye.V. Grygoriev, D.E. Lashennikov","doi":"10.1109/CRMICO.2000.1256190","DOIUrl":null,"url":null,"abstract":"The numerical researches on investigation of current distribution nature in plating are conducted at the effect of electromagnetic fields. The mechanisms leading to microscopic degradation of plating and edge effects origin are detected.","PeriodicalId":387003,"journal":{"name":"2000 10th International Crimean Microwave Conference. \"Microwave and Telecommunication Technology\". Conference Proceedings (IEEE Cat. No.00EX415)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The current distribution and heat localization in the integrated circuits plating at the effect of electromagnetic fields\",\"authors\":\"Ye.P. Taran, V. Starostenko, Ye.V. Grygoriev, D.E. Lashennikov\",\"doi\":\"10.1109/CRMICO.2000.1256190\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The numerical researches on investigation of current distribution nature in plating are conducted at the effect of electromagnetic fields. The mechanisms leading to microscopic degradation of plating and edge effects origin are detected.\",\"PeriodicalId\":387003,\"journal\":{\"name\":\"2000 10th International Crimean Microwave Conference. \\\"Microwave and Telecommunication Technology\\\". Conference Proceedings (IEEE Cat. No.00EX415)\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 10th International Crimean Microwave Conference. \\\"Microwave and Telecommunication Technology\\\". Conference Proceedings (IEEE Cat. No.00EX415)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CRMICO.2000.1256190\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 10th International Crimean Microwave Conference. \"Microwave and Telecommunication Technology\". Conference Proceedings (IEEE Cat. No.00EX415)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CRMICO.2000.1256190","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The current distribution and heat localization in the integrated circuits plating at the effect of electromagnetic fields
The numerical researches on investigation of current distribution nature in plating are conducted at the effect of electromagnetic fields. The mechanisms leading to microscopic degradation of plating and edge effects origin are detected.