软开关变换器中IGBT的计算机仿真与设计优化

I. Widjaja, A. Kurnia, D. Divan, K. Shenai
{"title":"软开关变换器中IGBT的计算机仿真与设计优化","authors":"I. Widjaja, A. Kurnia, D. Divan, K. Shenai","doi":"10.1109/ISPSD.1994.583664","DOIUrl":null,"url":null,"abstract":"The next generation of power semiconductor devices will be designed and optimized to meet the specific application requirements. Resonant dc link concept is gaining wide popularity in a range of soft-switching applications because of superior power conversion efficiency and improved overall system reliability. Mixed-mode simulations are used to study the carrier dynamics in non punchthrough IGBT structures during turn-off under soft- and hard-switching conditions. The simulation results are shown to qualitatively predict the measured bump in the tail current with varying output dv/dt conditions.","PeriodicalId":405897,"journal":{"name":"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Computer simulation and design optimization of IGBT's in soft-switching converters\",\"authors\":\"I. Widjaja, A. Kurnia, D. Divan, K. Shenai\",\"doi\":\"10.1109/ISPSD.1994.583664\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The next generation of power semiconductor devices will be designed and optimized to meet the specific application requirements. Resonant dc link concept is gaining wide popularity in a range of soft-switching applications because of superior power conversion efficiency and improved overall system reliability. Mixed-mode simulations are used to study the carrier dynamics in non punchthrough IGBT structures during turn-off under soft- and hard-switching conditions. The simulation results are shown to qualitatively predict the measured bump in the tail current with varying output dv/dt conditions.\",\"PeriodicalId\":405897,\"journal\":{\"name\":\"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-05-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.1994.583664\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1994.583664","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

摘要

下一代功率半导体器件将被设计和优化以满足特定的应用要求。谐振直流链路的概念在各种软开关应用中越来越受欢迎,因为它具有优越的功率转换效率和提高整体系统的可靠性。采用混合模式仿真研究了软开关和硬开关条件下非穿孔IGBT结构关断过程中的载流子动力学。仿真结果表明,在不同的输出dv/dt条件下,可以定性地预测尾电流的测量起伏。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Computer simulation and design optimization of IGBT's in soft-switching converters
The next generation of power semiconductor devices will be designed and optimized to meet the specific application requirements. Resonant dc link concept is gaining wide popularity in a range of soft-switching applications because of superior power conversion efficiency and improved overall system reliability. Mixed-mode simulations are used to study the carrier dynamics in non punchthrough IGBT structures during turn-off under soft- and hard-switching conditions. The simulation results are shown to qualitatively predict the measured bump in the tail current with varying output dv/dt conditions.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信