{"title":"弹性薄介质中地下分层的被动红外探测","authors":"R. Linebarger, B. Tittmann","doi":"10.1109/ULTSYM.1985.198550","DOIUrl":null,"url":null,"abstract":"The potential of thermal wave microscopy to provide a noncontact approach to the detection of subsurface d elaminations and microstructures in a variety of materials is quite promising. Thermal waves may be generated in a given medium via either ultrasonic wave absorption or direct laser irradiation. This paper describes the application of a scanning infrared technique to detect and characterize subsurface delaminations in a thin multilayer Mylar polyester film sample, utilizing ultrasonic excitation.","PeriodicalId":240321,"journal":{"name":"IEEE 1985 Ultrasonics Symposium","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Passive Infrared Detection of Subsurface Delaminations in Thin Elastic Media\",\"authors\":\"R. Linebarger, B. Tittmann\",\"doi\":\"10.1109/ULTSYM.1985.198550\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The potential of thermal wave microscopy to provide a noncontact approach to the detection of subsurface d elaminations and microstructures in a variety of materials is quite promising. Thermal waves may be generated in a given medium via either ultrasonic wave absorption or direct laser irradiation. This paper describes the application of a scanning infrared technique to detect and characterize subsurface delaminations in a thin multilayer Mylar polyester film sample, utilizing ultrasonic excitation.\",\"PeriodicalId\":240321,\"journal\":{\"name\":\"IEEE 1985 Ultrasonics Symposium\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 1985 Ultrasonics Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ULTSYM.1985.198550\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1985 Ultrasonics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ULTSYM.1985.198550","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Passive Infrared Detection of Subsurface Delaminations in Thin Elastic Media
The potential of thermal wave microscopy to provide a noncontact approach to the detection of subsurface d elaminations and microstructures in a variety of materials is quite promising. Thermal waves may be generated in a given medium via either ultrasonic wave absorption or direct laser irradiation. This paper describes the application of a scanning infrared technique to detect and characterize subsurface delaminations in a thin multilayer Mylar polyester film sample, utilizing ultrasonic excitation.
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