/spl mu/BGA焊点的振动疲劳

P. Tu, Y. Chan, C. Tang, J. Lai
{"title":"/spl mu/BGA焊点的振动疲劳","authors":"P. Tu, Y. Chan, C. Tang, J. Lai","doi":"10.1109/ECTC.2000.853388","DOIUrl":null,"url":null,"abstract":"This paper studies the vibration fatigue failure of /spl mu/BGA solder-joints reflowed with different temperature profiles, and ageing at 120/spl deg/C for 1, 4, 9, 16, 25, 36 days. The effect of the thickness of the Ni/sub 3/Sn/sub 4/ and Cu-Sn intermetallic compound (IMC) on the fatigue lifetime is also reported. During the vibration fatigue test, in order to identify the failure of /spl mu/BGA solder joint, electrical interruption was monitored continuously through the daisy-chain network. Our results show that the fatigue lifetime of the solder joint firstly increases and then decreases with increasing heating factor (Q/sub n/), which is defined as the integral of the measured temperature over the dwell time above liquidus (183/spl deg/C) in the reflow profile. The greatest lifetime occurs when Q/sub n/ is near 500 s/spl deg/C. Moreover, the lifetime of the solder joint decreases linearly with the increasing fourth root of the ageing time. The SEM/EDX inspection shows that only Ni/sub 3/Sn/sub 4/ IMC and Cu/sub 6/Sn/sub 5//Cu/sub 3/Sn IMCs are formed between the solder and the nickel-plated PCB pad, and the solder/component-metallization interface respectively. For non-aged samples reflowed with different profiles, the fatigue crack generally initiates at valleys in the rough surface of the interface of the Ni/sub 3/Sn/sub 4/ IMC with the bulk solder. Then it propagates mostly near the Ni/solder, and occasionally in the IMC layer or along the Ni/solder interface. For aged samples, the fatigue crack mostly initiates and propagates in the Cu/sub 6/Sn/sub 5/-phase/bulksolder interface or the Cu/sub 3/Sn/Cu/sub 6/Sn/sub 5/ interface on component-metallization. Evidently, the intermetallic compounds contribute mainly to the fatigue failure of /spl mu/BGA solder joints. The thicker the IMC layer, the shorter the fatigue lifetime of solder joint. The initial formation of the IMCs at the interface during soldering ensures a good metallurgical bond between the solder and the substrate. However, a thick IMC layer influences the solder joint strength, which results in mechanical failure due to volume shrinkage during the transformation from solid phase to the intermetallic compound.","PeriodicalId":410140,"journal":{"name":"2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Vibration fatigue of /spl mu/BGA solder joint\",\"authors\":\"P. Tu, Y. Chan, C. Tang, J. Lai\",\"doi\":\"10.1109/ECTC.2000.853388\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper studies the vibration fatigue failure of /spl mu/BGA solder-joints reflowed with different temperature profiles, and ageing at 120/spl deg/C for 1, 4, 9, 16, 25, 36 days. The effect of the thickness of the Ni/sub 3/Sn/sub 4/ and Cu-Sn intermetallic compound (IMC) on the fatigue lifetime is also reported. During the vibration fatigue test, in order to identify the failure of /spl mu/BGA solder joint, electrical interruption was monitored continuously through the daisy-chain network. Our results show that the fatigue lifetime of the solder joint firstly increases and then decreases with increasing heating factor (Q/sub n/), which is defined as the integral of the measured temperature over the dwell time above liquidus (183/spl deg/C) in the reflow profile. The greatest lifetime occurs when Q/sub n/ is near 500 s/spl deg/C. Moreover, the lifetime of the solder joint decreases linearly with the increasing fourth root of the ageing time. The SEM/EDX inspection shows that only Ni/sub 3/Sn/sub 4/ IMC and Cu/sub 6/Sn/sub 5//Cu/sub 3/Sn IMCs are formed between the solder and the nickel-plated PCB pad, and the solder/component-metallization interface respectively. For non-aged samples reflowed with different profiles, the fatigue crack generally initiates at valleys in the rough surface of the interface of the Ni/sub 3/Sn/sub 4/ IMC with the bulk solder. Then it propagates mostly near the Ni/solder, and occasionally in the IMC layer or along the Ni/solder interface. For aged samples, the fatigue crack mostly initiates and propagates in the Cu/sub 6/Sn/sub 5/-phase/bulksolder interface or the Cu/sub 3/Sn/Cu/sub 6/Sn/sub 5/ interface on component-metallization. Evidently, the intermetallic compounds contribute mainly to the fatigue failure of /spl mu/BGA solder joints. The thicker the IMC layer, the shorter the fatigue lifetime of solder joint. The initial formation of the IMCs at the interface during soldering ensures a good metallurgical bond between the solder and the substrate. However, a thick IMC layer influences the solder joint strength, which results in mechanical failure due to volume shrinkage during the transformation from solid phase to the intermetallic compound.\",\"PeriodicalId\":410140,\"journal\":{\"name\":\"2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.2000.853388\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2000.853388","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10

摘要

研究了不同温度分布回流焊/spl mu/BGA焊点的振动疲劳破坏,以及在120/spl℃下时效1、4、9、16、25、36天。还报道了Ni/sub - 3/Sn/sub - 4/和Cu-Sn金属间化合物(IMC)厚度对疲劳寿命的影响。在振动疲劳试验过程中,为了识别/spl mu/BGA焊点的失效,通过菊花链网络连续监测电中断。结果表明,随着加热系数(Q/sub / n/)的增加,焊点的疲劳寿命先增加后减少,加热系数定义为测量温度与回流曲线中高于液相线(183/spl℃)停留时间的积分。当Q/sub /接近500 s/spl℃时,寿命最大。随着时效时间的四次方根增大,焊点寿命呈线性递减。SEM/EDX检测表明,在焊料与镀镍PCB焊盘之间和焊料/元件-金属化界面之间分别仅形成Ni/sub 3/Sn/sub 4/ IMC和Cu/sub 6/Sn/sub 5//Cu/sub 3/Sn IMC。对于不同轮廓回流的未时效试样,疲劳裂纹一般在Ni/sub 3/Sn/sub 4/ IMC与本体焊料界面粗糙表面的山谷处开始。然后,它主要在Ni/钎料附近传播,偶尔在IMC层或沿Ni/钎料界面传播。时效试样的疲劳裂纹主要在Cu/sub - 6/Sn/sub - 5/相/大块焊料界面或Cu/sub - 3/Sn/Cu/sub - 6/Sn/sub - 5/组件金属化界面萌生和扩展。显然,金属间化合物是导致/spl mu/BGA焊点疲劳失效的主要原因。IMC层越厚,焊点的疲劳寿命越短。在焊接过程中,imc在界面处的初始形成确保了焊料和衬底之间良好的冶金结合。然而,较厚的IMC层会影响焊点的强度,在从固相到金属间化合物的转变过程中,由于体积收缩导致机械失效。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Vibration fatigue of /spl mu/BGA solder joint
This paper studies the vibration fatigue failure of /spl mu/BGA solder-joints reflowed with different temperature profiles, and ageing at 120/spl deg/C for 1, 4, 9, 16, 25, 36 days. The effect of the thickness of the Ni/sub 3/Sn/sub 4/ and Cu-Sn intermetallic compound (IMC) on the fatigue lifetime is also reported. During the vibration fatigue test, in order to identify the failure of /spl mu/BGA solder joint, electrical interruption was monitored continuously through the daisy-chain network. Our results show that the fatigue lifetime of the solder joint firstly increases and then decreases with increasing heating factor (Q/sub n/), which is defined as the integral of the measured temperature over the dwell time above liquidus (183/spl deg/C) in the reflow profile. The greatest lifetime occurs when Q/sub n/ is near 500 s/spl deg/C. Moreover, the lifetime of the solder joint decreases linearly with the increasing fourth root of the ageing time. The SEM/EDX inspection shows that only Ni/sub 3/Sn/sub 4/ IMC and Cu/sub 6/Sn/sub 5//Cu/sub 3/Sn IMCs are formed between the solder and the nickel-plated PCB pad, and the solder/component-metallization interface respectively. For non-aged samples reflowed with different profiles, the fatigue crack generally initiates at valleys in the rough surface of the interface of the Ni/sub 3/Sn/sub 4/ IMC with the bulk solder. Then it propagates mostly near the Ni/solder, and occasionally in the IMC layer or along the Ni/solder interface. For aged samples, the fatigue crack mostly initiates and propagates in the Cu/sub 6/Sn/sub 5/-phase/bulksolder interface or the Cu/sub 3/Sn/Cu/sub 6/Sn/sub 5/ interface on component-metallization. Evidently, the intermetallic compounds contribute mainly to the fatigue failure of /spl mu/BGA solder joints. The thicker the IMC layer, the shorter the fatigue lifetime of solder joint. The initial formation of the IMCs at the interface during soldering ensures a good metallurgical bond between the solder and the substrate. However, a thick IMC layer influences the solder joint strength, which results in mechanical failure due to volume shrinkage during the transformation from solid phase to the intermetallic compound.
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