电力电子应用中提高IGBT可靠性的研究

2015 International Semiconductor Conference (CAS) Pub Date : 2015-12-17 DOI:10.1109/SMICND.2015.7355149

V. Sundaramoorthy, E. Bianda, G. Riedel

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引用次数: 2

摘要

根据IGBT模块结温进行寿命预测是提高电力电子系统可靠性的一个重要方面。本文讨论了从电学特性估计IGBT结温的方法。同时提出了一种防止牵引变流器中igbt发生爆炸的解决方案。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A study to improve IGBT reliability in power electronics applications

Lifetime prediction of IGBT modules from their junction temperature is an important aspect to improve the reliability of power electronic systems. Here, methods to estimate the IGBT junction temperature from its electrical characteristics are discussed. A solution is also proposed to avoid explosion of IGBTs used in traction converters.

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来源期刊

2015 International Semiconductor Conference (CAS)

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