基于源侧注入闪存的语音存储与回放系统中多电平模拟存储器的可靠性

A.V. Kordesch, S. Awsare, J. Brennan, P. Guo, M. Hemming, M. Herman, P. Holzmann, E. Ng, Chun-Mai Liu, K. Su, C. Wang, M. Wu
{"title":"基于源侧注入闪存的语音存储与回放系统中多电平模拟存储器的可靠性","authors":"A.V. Kordesch, S. Awsare, J. Brennan, P. Guo, M. Hemming, M. Herman, P. Holzmann, E. Ng, Chun-Mai Liu, K. Su, C. Wang, M. Wu","doi":"10.1109/VTSA.1999.786051","DOIUrl":null,"url":null,"abstract":"The reliability of a multilevel analog memory is mainly determined by data retention, cycling endurance, and read and write disturb. This storage system retains a voice message for 10 years and can record continuously for 50 K cycles. It can tolerate up to 300 single cell retention shifts >50 mV and still meet THD<0.5% and SINAD>32 dB.","PeriodicalId":237214,"journal":{"name":"1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"The reliability of multilevel analog memory in a voice storage and playback system using source-side injection flash\",\"authors\":\"A.V. Kordesch, S. Awsare, J. Brennan, P. Guo, M. Hemming, M. Herman, P. Holzmann, E. Ng, Chun-Mai Liu, K. Su, C. Wang, M. Wu\",\"doi\":\"10.1109/VTSA.1999.786051\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The reliability of a multilevel analog memory is mainly determined by data retention, cycling endurance, and read and write disturb. This storage system retains a voice message for 10 years and can record continuously for 50 K cycles. It can tolerate up to 300 single cell retention shifts >50 mV and still meet THD<0.5% and SINAD>32 dB.\",\"PeriodicalId\":237214,\"journal\":{\"name\":\"1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-06-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTSA.1999.786051\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTSA.1999.786051","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

多电平模拟存储器的可靠性主要取决于数据保留、循环寿命和读写干扰。该存储系统可保留语音信息10年,并可连续录制50k周期。它可以承受高达300个>50 mV的单细胞保留位移,并且仍然满足THD32 dB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The reliability of multilevel analog memory in a voice storage and playback system using source-side injection flash
The reliability of a multilevel analog memory is mainly determined by data retention, cycling endurance, and read and write disturb. This storage system retains a voice message for 10 years and can record continuously for 50 K cycles. It can tolerate up to 300 single cell retention shifts >50 mV and still meet THD<0.5% and SINAD>32 dB.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信