{"title":"金属外壳内任意位置电缆感应电压的数值研究","authors":"L. Nuño, C.L. Holloway, P. Wilson","doi":"10.1109/EMCEUROPE.2008.4786891","DOIUrl":null,"url":null,"abstract":"In this paper, we investigate the induced voltage on a cable when placed at random locations inside a metallic enclosure. The analysis consists of a cable of defined length and fixed terminals, but different layouts, placed in a metallic enclosure containing an aperture. The induced voltages for the different layouts are computed for a plane wave incident on the aperture. A second analysis is performed with no cable (i.e., an empty enclosure) and the results are compared to those for the cable present. The results are compared to the resonance frequencies of the closed cavity and the aperture.","PeriodicalId":133902,"journal":{"name":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Numerical investigation of the induced voltage on a cable placed at random locations inside a metallic enclosure\",\"authors\":\"L. Nuño, C.L. Holloway, P. Wilson\",\"doi\":\"10.1109/EMCEUROPE.2008.4786891\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we investigate the induced voltage on a cable when placed at random locations inside a metallic enclosure. The analysis consists of a cable of defined length and fixed terminals, but different layouts, placed in a metallic enclosure containing an aperture. The induced voltages for the different layouts are computed for a plane wave incident on the aperture. A second analysis is performed with no cable (i.e., an empty enclosure) and the results are compared to those for the cable present. The results are compared to the resonance frequencies of the closed cavity and the aperture.\",\"PeriodicalId\":133902,\"journal\":{\"name\":\"2008 International Symposium on Electromagnetic Compatibility - EMC Europe\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 International Symposium on Electromagnetic Compatibility - EMC Europe\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCEUROPE.2008.4786891\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEUROPE.2008.4786891","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Numerical investigation of the induced voltage on a cable placed at random locations inside a metallic enclosure
In this paper, we investigate the induced voltage on a cable when placed at random locations inside a metallic enclosure. The analysis consists of a cable of defined length and fixed terminals, but different layouts, placed in a metallic enclosure containing an aperture. The induced voltages for the different layouts are computed for a plane wave incident on the aperture. A second analysis is performed with no cable (i.e., an empty enclosure) and the results are compared to those for the cable present. The results are compared to the resonance frequencies of the closed cavity and the aperture.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
