采用单调迭代法对亚微米mosfet进行二维模拟

Yiming Li, S. Chung, Jinn-Liang Liu
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引用次数: 15

摘要

提出了一种新的半导体器件方程的数值求解方法——单调迭代法。这种建设性的方法旨在减轻一些主要困难,特别是与牛顿方法有关,牛顿方法是迄今为止解决非线性半导体器件方程的主要方法。该方法在亚微米MOSFET的各种偏置条件下具有任意初始猜想的全局收敛性。与牛顿迭代(NI)方法相比,MI方法可将CPU时间提高30倍。该方法具有高度并行性,易于实现二维和三维仿真。在亚微米N-MOSFET器件上进行了不同偏置条件和初始猜测的数值模拟,验证了该方法的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A novel approach for the two-dimensional simulation of submicron MOSFETs using monotone iterative method
A new approach, called monotone iterative (MI) method, for the numerical solution of semiconductor device equations is presented. This constructive method is intended to alleviate some major difficulties particularly associated with Newton's method that is the principal methodology to date for the solution of nonlinear semiconductor device equations. The method converges globally with arbitrary initial guess under various bias conditions for a submicron MOSFET. By comparing with a Newton's iterative (NI) method, a speed-up factor of 30 in CPU time can be achieved by the MI method. The method is highly parallel and easy to implement for two- and three-dimensional simulations. Numerical simulations on a submicron N-MOSFET device with various biasing conditions and initial guesses are presented to demonstrate the efficiency of the method.
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