通过模拟应用提高干式腐蚀设备的生产效率

S. Pampel, J. Domaschke, H. Jetter
{"title":"通过模拟应用提高干式腐蚀设备的生产效率","authors":"S. Pampel, J. Domaschke, H. Jetter","doi":"10.1109/ISSM.2000.993621","DOIUrl":null,"url":null,"abstract":"The standards of the semiconductor market with its specifications are leading to a basic demand for an increase in productivity. On a department level, this can be achieved through an increase in equipment throughput and/or in an increase in wafer starts at constant and/or less clean-room area used by the process group. Through simulation of Clustertools in various operation modes, possibilities were found to improve the operation of this equipment. In addition, Infineon Dresden was able to examine different hardware configurations in the dry etch sector. In concrete examples, discrete event simulation results of Clustertools showed possibilities for throughput increases and performance improvements of up to 20%, thus supporting the decisions for capacity developments and hardware alterations. The comparison with data from on-tool tests verified the simulation software and its results. Important general findings on the behaviour of Clustertools will be introduced.","PeriodicalId":104122,"journal":{"name":"Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Productivity improvement for dry etch equipment through the application of simulation\",\"authors\":\"S. Pampel, J. Domaschke, H. Jetter\",\"doi\":\"10.1109/ISSM.2000.993621\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The standards of the semiconductor market with its specifications are leading to a basic demand for an increase in productivity. On a department level, this can be achieved through an increase in equipment throughput and/or in an increase in wafer starts at constant and/or less clean-room area used by the process group. Through simulation of Clustertools in various operation modes, possibilities were found to improve the operation of this equipment. In addition, Infineon Dresden was able to examine different hardware configurations in the dry etch sector. In concrete examples, discrete event simulation results of Clustertools showed possibilities for throughput increases and performance improvements of up to 20%, thus supporting the decisions for capacity developments and hardware alterations. The comparison with data from on-tool tests verified the simulation software and its results. Important general findings on the behaviour of Clustertools will be introduced.\",\"PeriodicalId\":104122,\"journal\":{\"name\":\"Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130)\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSM.2000.993621\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSM.2000.993621","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

半导体市场的标准及其规格导致了对提高生产率的基本需求。在部门层面上,这可以通过增加设备吞吐量和/或在过程组使用的恒定和/或更少的洁净室面积下增加晶圆启动量来实现。通过对Clustertools在各种运行模式下的仿真,发现了改进该设备运行的可能性。此外,英飞凌德累斯顿能够检查干式蚀刻领域的不同硬件配置。在具体示例中,Clustertools的离散事件模拟结果显示吞吐量增加和性能改进的可能性高达20%,从而支持容量开发和硬件更改的决策。通过与工具上测试数据的对比,验证了仿真软件及其结果。本文将介绍关于Clustertools行为的一些重要的一般性发现。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Productivity improvement for dry etch equipment through the application of simulation
The standards of the semiconductor market with its specifications are leading to a basic demand for an increase in productivity. On a department level, this can be achieved through an increase in equipment throughput and/or in an increase in wafer starts at constant and/or less clean-room area used by the process group. Through simulation of Clustertools in various operation modes, possibilities were found to improve the operation of this equipment. In addition, Infineon Dresden was able to examine different hardware configurations in the dry etch sector. In concrete examples, discrete event simulation results of Clustertools showed possibilities for throughput increases and performance improvements of up to 20%, thus supporting the decisions for capacity developments and hardware alterations. The comparison with data from on-tool tests verified the simulation software and its results. Important general findings on the behaviour of Clustertools will be introduced.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信