{"title":"改进的串扰故障模型和生成任意核间互连拓扑测试的方法","authors":"Wichian Sirisaengtaksin, S. Gupta","doi":"10.1109/ATS.2002.1181705","DOIUrl":null,"url":null,"abstract":"In this paper we develop a new fault model for capacitive crosstalk in inter-core interconnects. We also develop a framework to generate compact tests for interconnects with arbitrary topologies. Experimental results show that the proposed approach can significantly reduce test application time for large interconnects. We are in the process of extending the framework to interconnects that include tri-state as well as bi-directional nets.","PeriodicalId":199542,"journal":{"name":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"Enhanced crosstalk fault model and methodology to generate tests for arbitrary inter-core interconnect topology\",\"authors\":\"Wichian Sirisaengtaksin, S. Gupta\",\"doi\":\"10.1109/ATS.2002.1181705\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we develop a new fault model for capacitive crosstalk in inter-core interconnects. We also develop a framework to generate compact tests for interconnects with arbitrary topologies. Experimental results show that the proposed approach can significantly reduce test application time for large interconnects. We are in the process of extending the framework to interconnects that include tri-state as well as bi-directional nets.\",\"PeriodicalId\":199542,\"journal\":{\"name\":\"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-11-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2002.1181705\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2002.1181705","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Enhanced crosstalk fault model and methodology to generate tests for arbitrary inter-core interconnect topology
In this paper we develop a new fault model for capacitive crosstalk in inter-core interconnects. We also develop a framework to generate compact tests for interconnects with arbitrary topologies. Experimental results show that the proposed approach can significantly reduce test application time for large interconnects. We are in the process of extending the framework to interconnects that include tri-state as well as bi-directional nets.