最好的人字拖扫描

M. Abramovici, J. J. Kulikowski, R. Roy
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引用次数: 79

摘要

本文提出了在部分扫描电路中选择最佳扫描触发器以实现最大故障覆盖率的一种新算法。该算法称为PASCAL(部分扫描分析),根据触发器对故障覆盖率的贡献对它们进行排名。PASCAL的结果提供了整个部分扫描设计谱(从无扫描到全扫描)的全局视图,并允许设计者估计任意数量扫描触发器可实现的故障覆盖率,并选择最小的触发器子集进行扫描以获得所需的故障覆盖率。通过考虑功能测试检测到的故障,可以减少扫描触发器的数量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The Best Flip-Flops to Scan
The full-scan and the nonscan versions of a circuit This paper presents a new algorithm for selecting the best flip-flops to scan for achieving maximum fault coverage in a partial-scan circuit. The algorithm, called PASCAL (PArtial Scan AnaLysis), ranks the flip-flops based on their contribution to the fault coverage. The results of PASCAL provide a global view of the entire partial-scan design spectrum (from no scan to full scan), and allow the designer to estimate the fault coverage achievable with any number of scanned flip-flops and to select the minimal subset of flip-flops to scan for obtaining a desired fault coverage. The number of scanned flip-flops can be reduced by taking into account faults detected by functional tests.
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