K. Tanigichi, S. Nagata, Xu Xiaolin, T. Uno, H. Yamamoto, T. Seki, S. Kawabata, N. Yamana
{"title":"应用彩色图像分析技术的小尺寸芯片电子零件表面缺陷检测","authors":"K. Tanigichi, S. Nagata, Xu Xiaolin, T. Uno, H. Yamamoto, T. Seki, S. Kawabata, N. Yamana","doi":"10.1109/IEMT.1993.639775","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":170695,"journal":{"name":"Proceedings of Japan International Electronic Manufacturing Technology Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Surface Deftct Inspection For Small Sizes Of Chip- Electronic-Parts Applying Color lmage Analysis Techniques\",\"authors\":\"K. Tanigichi, S. Nagata, Xu Xiaolin, T. Uno, H. Yamamoto, T. Seki, S. Kawabata, N. Yamana\",\"doi\":\"10.1109/IEMT.1993.639775\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":170695,\"journal\":{\"name\":\"Proceedings of Japan International Electronic Manufacturing Technology Symposium\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-06-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Japan International Electronic Manufacturing Technology Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.1993.639775\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Japan International Electronic Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1993.639775","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}